Image scanning method for slice scanner and pathological slice reading all-in-one machine
The invention discloses an image scanning method for a slice scanner and a pathological film reading all-in-one machine, and the method comprises the steps: controlling a camera scanning assembly to move along a specified path so as to scan a photographed object, and collecting a scanning image from...
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creator | PENG WEI YU LI XU CHUANLING HAN FANGJIAN LU JIA |
description | The invention discloses an image scanning method for a slice scanner and a pathological film reading all-in-one machine, and the method comprises the steps: controlling a camera scanning assembly to move along a specified path so as to scan a photographed object, and collecting a scanning image from the camera scanning assembly, at the same time, after every n scanning images are collected, splicing operation is carried out on the n collected scanning images at a speed which is the same as or similar to that of the n collected scanning images, so that the time t1 required for collecting the n scanning images is the same as or similar to the time t2 required for carrying out splicing operation on the n collected scanning images, and the time t3 required for collecting the n scanning images is the same as or similar to the time t2 required for carrying out splicing operation on the n collected scanning images; and obtaining a complete spliced image after all the scanned images are spliced. According to the meth |
format | Patent |
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According to the meth</description><language>chi ; eng</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221227&DB=EPODOC&CC=CN&NR=115529395A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221227&DB=EPODOC&CC=CN&NR=115529395A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PENG WEI</creatorcontrib><creatorcontrib>YU LI</creatorcontrib><creatorcontrib>XU CHUANLING</creatorcontrib><creatorcontrib>HAN FANGJIAN</creatorcontrib><creatorcontrib>LU JIA</creatorcontrib><title>Image scanning method for slice scanner and pathological slice reading all-in-one machine</title><description>The invention discloses an image scanning method for a slice scanner and a pathological film reading all-in-one machine, and the method comprises the steps: controlling a camera scanning assembly to move along a specified path so as to scan a photographed object, and collecting a scanning image from the camera scanning assembly, at the same time, after every n scanning images are collected, splicing operation is carried out on the n collected scanning images at a speed which is the same as or similar to that of the n collected scanning images, so that the time t1 required for collecting the n scanning images is the same as or similar to the time t2 required for carrying out splicing operation on the n collected scanning images, and the time t3 required for collecting the n scanning images is the same as or similar to the time t2 required for carrying out splicing operation on the n collected scanning images; and obtaining a complete spliced image after all the scanned images are spliced. According to the meth</description><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyzEOwjAMheEsDAi4gzlAhlJl6IiqIliYWJgqK3HTSI4TJb2_ACkHYHrD9_69ej8ieoJqUSSIh0jbmhwsqUDlYJtQARQHGb_IyQeL3LgQul-HzDqITkIQ0a5B6Kh2C3KlU9uDOt-m13jXlNNMNaMloW0en11nzGXoB3Pt__l8AKY6Ojs</recordid><startdate>20221227</startdate><enddate>20221227</enddate><creator>PENG WEI</creator><creator>YU LI</creator><creator>XU CHUANLING</creator><creator>HAN FANGJIAN</creator><creator>LU JIA</creator><scope>EVB</scope></search><sort><creationdate>20221227</creationdate><title>Image scanning method for slice scanner and pathological slice reading all-in-one machine</title><author>PENG WEI ; YU LI ; XU CHUANLING ; HAN FANGJIAN ; LU JIA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115529395A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PENG WEI</creatorcontrib><creatorcontrib>YU LI</creatorcontrib><creatorcontrib>XU CHUANLING</creatorcontrib><creatorcontrib>HAN FANGJIAN</creatorcontrib><creatorcontrib>LU JIA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PENG WEI</au><au>YU LI</au><au>XU CHUANLING</au><au>HAN FANGJIAN</au><au>LU JIA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Image scanning method for slice scanner and pathological slice reading all-in-one machine</title><date>2022-12-27</date><risdate>2022</risdate><abstract>The invention discloses an image scanning method for a slice scanner and a pathological film reading all-in-one machine, and the method comprises the steps: controlling a camera scanning assembly to move along a specified path so as to scan a photographed object, and collecting a scanning image from the camera scanning assembly, at the same time, after every n scanning images are collected, splicing operation is carried out on the n collected scanning images at a speed which is the same as or similar to that of the n collected scanning images, so that the time t1 required for collecting the n scanning images is the same as or similar to the time t2 required for carrying out splicing operation on the n collected scanning images, and the time t3 required for collecting the n scanning images is the same as or similar to the time t2 required for carrying out splicing operation on the n collected scanning images; and obtaining a complete spliced image after all the scanned images are spliced. According to the meth</abstract><oa>free_for_read</oa></addata></record> |
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subjects | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING |
title | Image scanning method for slice scanner and pathological slice reading all-in-one machine |
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