Structural deformation detection method, system and device, electronic equipment and medium
The invention discloses a structural deformation detection method, system and device, electronic equipment and a medium. The method comprises the following steps: receiving a coordinate system of an environment where a detected structure is located sent by a detection device, receiving point cloud d...
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| creator | MA LIANG ZHOU FENG JIA BAORONG LIU WEI SHEN ZEXIN LI JIQING SHEN JIAQING JIANG LINGLING |
| description | The invention discloses a structural deformation detection method, system and device, electronic equipment and a medium. The method comprises the following steps: receiving a coordinate system of an environment where a detected structure is located sent by a detection device, receiving point cloud data obtained by scanning a plurality of position points in the coordinate system of the detected structure sent by the detection device, and carrying out splicing processing based on the position point-to-point cloud data to obtain overall point cloud data of the detected structure; and matching the overall point cloud data of the detected structure with the comparison object, and determining deformation information of the overall point cloud data of the detected structure relative to the comparison object. Deformation errors in different stages are efficiently found, and the entity position where the deformation area is located is rapidly positioned.
本发明公开了一种结构变形检测方法、系统、装置、电子设备及介质。该方法通过接收检测设备发送的被检测结构所在环境的坐标系，接收检测设 |
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本发明公开了一种结构变形检测方法、系统、装置、电子设备及介质。该方法通过接收检测设备发送的被检测结构所在环境的坐标系，接收检测设</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221227&DB=EPODOC&CC=CN&NR=115526918A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221227&DB=EPODOC&CC=CN&NR=115526918A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MA LIANG</creatorcontrib><creatorcontrib>ZHOU FENG</creatorcontrib><creatorcontrib>JIA BAORONG</creatorcontrib><creatorcontrib>LIU WEI</creatorcontrib><creatorcontrib>SHEN ZEXIN</creatorcontrib><creatorcontrib>LI JIQING</creatorcontrib><creatorcontrib>SHEN JIAQING</creatorcontrib><creatorcontrib>JIANG LINGLING</creatorcontrib><title>Structural deformation detection method, system and device, electronic equipment and medium</title><description>The invention discloses a structural deformation detection method, system and device, electronic equipment and a medium. The method comprises the following steps: receiving a coordinate system of an environment where a detected structure is located sent by a detection device, receiving point cloud data obtained by scanning a plurality of position points in the coordinate system of the detected structure sent by the detection device, and carrying out splicing processing based on the position point-to-point cloud data to obtain overall point cloud data of the detected structure; and matching the overall point cloud data of the detected structure with the comparison object, and determining deformation information of the overall point cloud data of the detected structure relative to the comparison object. Deformation errors in different stages are efficiently found, and the entity position where the deformation area is located is rapidly positioned.
本发明公开了一种结构变形检测方法、系统、装置、电子设备及介质。该方法通过接收检测设备发送的被检测结构所在环境的坐标系，接收检测设</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyr0KwjAYheEsDqLeQ9zrEKWioxTFyUU3hxKSUxrIn8kXwbs3FC_A6bxwnjl73ikVRSVJyzWGkJwkE3xtgprKgcagG54_meC49Lqeb6PQcNhqUvBGcbyKiQ6eJuCgTXFLNhukzVj9dsHWl_Oju24QQ48cpYIH9d1NiLbd7o_icNr9Y76_Ojvz</recordid><startdate>20221227</startdate><enddate>20221227</enddate><creator>MA LIANG</creator><creator>ZHOU FENG</creator><creator>JIA BAORONG</creator><creator>LIU WEI</creator><creator>SHEN ZEXIN</creator><creator>LI JIQING</creator><creator>SHEN JIAQING</creator><creator>JIANG LINGLING</creator><scope>EVB</scope></search><sort><creationdate>20221227</creationdate><title>Structural deformation detection method, system and device, electronic equipment and medium</title><author>MA LIANG ; ZHOU FENG ; JIA BAORONG ; LIU WEI ; SHEN ZEXIN ; LI JIQING ; SHEN JIAQING ; JIANG LINGLING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115526918A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>MA LIANG</creatorcontrib><creatorcontrib>ZHOU FENG</creatorcontrib><creatorcontrib>JIA BAORONG</creatorcontrib><creatorcontrib>LIU WEI</creatorcontrib><creatorcontrib>SHEN ZEXIN</creatorcontrib><creatorcontrib>LI JIQING</creatorcontrib><creatorcontrib>SHEN JIAQING</creatorcontrib><creatorcontrib>JIANG LINGLING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MA LIANG</au><au>ZHOU FENG</au><au>JIA BAORONG</au><au>LIU WEI</au><au>SHEN ZEXIN</au><au>LI JIQING</au><au>SHEN JIAQING</au><au>JIANG LINGLING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Structural deformation detection method, system and device, electronic equipment and medium</title><date>2022-12-27</date><risdate>2022</risdate><abstract>The invention discloses a structural deformation detection method, system and device, electronic equipment and a medium. The method comprises the following steps: receiving a coordinate system of an environment where a detected structure is located sent by a detection device, receiving point cloud data obtained by scanning a plurality of position points in the coordinate system of the detected structure sent by the detection device, and carrying out splicing processing based on the position point-to-point cloud data to obtain overall point cloud data of the detected structure; and matching the overall point cloud data of the detected structure with the comparison object, and determining deformation information of the overall point cloud data of the detected structure relative to the comparison object. Deformation errors in different stages are efficiently found, and the entity position where the deformation area is located is rapidly positioned.
本发明公开了一种结构变形检测方法、系统、装置、电子设备及介质。该方法通过接收检测设备发送的被检测结构所在环境的坐标系，接收检测设</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | Structural deformation detection method, system and device, electronic equipment and medium |
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