Rapid quartz crystal oscillator testing device

The invention relates to a rapid quartz crystal oscillator testing device, which relates to the field of electronic component testing and comprises a high-low temperature box body, a mounting plate and a driving assembly. A closed annular test groove is formed in the mounting plate; the driving asse...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG JIANYING, LIU HUIGUANG, WANG GAN, SUN GANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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