Rapid quartz crystal oscillator testing device

Rapid quartz crystal oscillator testing device

The invention relates to a rapid quartz crystal oscillator testing device, which relates to the field of electronic component testing and comprises a high-low temperature box body, a mounting plate and a driving assembly. A closed annular test groove is formed in the mounting plate; the driving asse...

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Hauptverfasser: WANG JIANYING, LIU HUIGUANG, WANG GAN, SUN GANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator WANG JIANYING
LIU HUIGUANG
WANG GAN
SUN GANG
description The invention relates to a rapid quartz crystal oscillator testing device, which relates to the field of electronic component testing and comprises a high-low temperature box body, a mounting plate and a driving assembly. A closed annular test groove is formed in the mounting plate; the driving assembly comprises a transmission chain slidably connected in the annular testing groove and a driving part for driving the transmission chain to move in the annular testing groove; the transmission chain comprises a plurality of chain link pieces, the chain link pieces are connected in series, and each chain link piece is provided with an installation groove used for containing the corresponding quartz crystal oscillator. When the quartz crystal oscillators are tested, each quartz crystal oscillator is mounted in the corresponding mounting groove, the driving part drives the transmission chain to move along the annular testing groove, each quartz crystal oscillator reciprocates on the mounting plate, and the quartz cr
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Rapid quartz crystal oscillator testing device
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