Metrology collection based on device characteristic information

The invention relates to metric collection based on device characteristic information. A method includes determining, by a controller device managing a plurality of network devices, device characteristic information for a network device of the plurality of network devices, and selecting, by the cont...

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Bibliographische Detailangaben
Hauptverfasser: PAI RAGHURAM MAPOOR, OTEMARECA, LILLANTH, M, GADDE, VIJAY, KUMAR, LAKSHMIKANTHI, HARSHA, SANKAR, SRI, RAM, MARSHALL JEFFREY S, VIJAYENPANNINI, SHASHANKAR
Format: Patent
Sprache:chi ; eng
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