Wafer jig structure and processing equipment causing high-temperature latent deformation
The invention provides a wafer jig structure and processing equipment for causing high-temperature latent deformation. The wafer jig structure mainly comprises two separable jigs. The first jig is provided with a first inclined plane, and the second jig is provided with another second inclined plane...
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Format: | Patent |
Sprache: | chi ; eng |
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