Electronic product analysis method and device, computer equipment and storage medium
The invention relates to an electronic product analysis method and device, computer equipment and a storage medium, and the method comprises the steps: carrying out the simulation analysis of an electronic product, obtaining the fault information and each level of the electronic product, building a...
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creator | PAN YONG YANG YANCHAO LAI ZHE NIE GUOJIAN ZHANG JIEYI ZHANG LINGJIE YANG HONGQI HU NING |
description | The invention relates to an electronic product analysis method and device, computer equipment and a storage medium, and the method comprises the steps: carrying out the simulation analysis of an electronic product, obtaining the fault information and each level of the electronic product, building a fault transmission model according to the fault information and each level, and carrying out the analysis of the electronic product based on the fault transmission model. And performing fault influence analysis and fault tree analysis on the electronic product to obtain a reliability analysis result of the electronic product, constructing a correlation matrix based on the fault transmission model, and obtaining a testability analysis result of the electronic product according to the correlation matrix. Through the fault information and the fault transmission model constructed by each level, collaborative modeling and analysis of reliability and correlation of the electronic product can be realized, and design analy |
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And performing fault influence analysis and fault tree analysis on the electronic product to obtain a reliability analysis result of the electronic product, constructing a correlation matrix based on the fault transmission model, and obtaining a testability analysis result of the electronic product according to the correlation matrix. 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And performing fault influence analysis and fault tree analysis on the electronic product to obtain a reliability analysis result of the electronic product, constructing a correlation matrix based on the fault transmission model, and obtaining a testability analysis result of the electronic product according to the correlation matrix. 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language | chi ; eng |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
title | Electronic product analysis method and device, computer equipment and storage medium |
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