Automatic quality inspection rule configuration method and device based on rule and semantic analysis

The invention discloses a quality inspection rule automatic configuration method and device based on rule and semantic analysis. The method comprises the steps that data element result information is acquired; performing keyword matching and entity recognition on the obtained data element result fie...

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Hauptverfasser: HU CHENGSHENG, ZHOU CHONGYI, WEN YANLONG, ZHENG XI, XIU XIN, ZHANG CHUNZI, ZHU LIFENG, LIU GUODONG, GUO LI, LIN XIMING, QIAO QINWANG, ZHAO JIAN, LU ZHIPENG, FAN GUOHAO
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creator HU CHENGSHENG
ZHOU CHONGYI
WEN YANLONG
ZHENG XI
XIU XIN
ZHANG CHUNZI
ZHU LIFENG
LIU GUODONG
GUO LI
LIN XIMING
QIAO QINWANG
ZHAO JIAN
LU ZHIPENG
FAN GUOHAO
description The invention discloses a quality inspection rule automatic configuration method and device based on rule and semantic analysis. The method comprises the steps that data element result information is acquired; performing keyword matching and entity recognition on the obtained data element result field name information to preliminarily detect first field information needing independent quality inspection; the value of the first field information needing independent quality inspection is judged to determine the type and the feature of the first field information; according to the type and the feature of the first field information, identifying second field information needing independent quality inspection in a data element result by using a pre-constructed tree model; based on the identified field information item of the second field information, determining a bid falling permission corresponding to the second field information; and configuring a corresponding quality inspection rule operator according to the
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115221893A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115221893A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115221893A3</originalsourceid><addsrcrecordid>eNqNjDEKwkAQRbexEPUOkwNYJEHQMgTFyso-jLsTHdjMrpldIbeXiPZWH957_KWhJqcwYGILz4ye0wQsGskmDgJj9gQ2SM_3POIHDZQewQGKA0cvtgQ3VHLwq2ehNKDMlyjoJ2Vdm0WPXmnz3ZUpTsdre95SDB1pREtCqWsvZbmrqnJ_qJv6n-YNf9A_qw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic quality inspection rule configuration method and device based on rule and semantic analysis</title><source>esp@cenet</source><creator>HU CHENGSHENG ; ZHOU CHONGYI ; WEN YANLONG ; ZHENG XI ; XIU XIN ; ZHANG CHUNZI ; ZHU LIFENG ; LIU GUODONG ; GUO LI ; LIN XIMING ; QIAO QINWANG ; ZHAO JIAN ; LU ZHIPENG ; FAN GUOHAO</creator><creatorcontrib>HU CHENGSHENG ; ZHOU CHONGYI ; WEN YANLONG ; ZHENG XI ; XIU XIN ; ZHANG CHUNZI ; ZHU LIFENG ; LIU GUODONG ; GUO LI ; LIN XIMING ; QIAO QINWANG ; ZHAO JIAN ; LU ZHIPENG ; FAN GUOHAO</creatorcontrib><description>The invention discloses a quality inspection rule automatic configuration method and device based on rule and semantic analysis. The method comprises the steps that data element result information is acquired; performing keyword matching and entity recognition on the obtained data element result field name information to preliminarily detect first field information needing independent quality inspection; the value of the first field information needing independent quality inspection is judged to determine the type and the feature of the first field information; according to the type and the feature of the first field information, identifying second field information needing independent quality inspection in a data element result by using a pre-constructed tree model; based on the identified field information item of the second field information, determining a bid falling permission corresponding to the second field information; and configuring a corresponding quality inspection rule operator according to the</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221021&amp;DB=EPODOC&amp;CC=CN&amp;NR=115221893A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221021&amp;DB=EPODOC&amp;CC=CN&amp;NR=115221893A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HU CHENGSHENG</creatorcontrib><creatorcontrib>ZHOU CHONGYI</creatorcontrib><creatorcontrib>WEN YANLONG</creatorcontrib><creatorcontrib>ZHENG XI</creatorcontrib><creatorcontrib>XIU XIN</creatorcontrib><creatorcontrib>ZHANG CHUNZI</creatorcontrib><creatorcontrib>ZHU LIFENG</creatorcontrib><creatorcontrib>LIU GUODONG</creatorcontrib><creatorcontrib>GUO LI</creatorcontrib><creatorcontrib>LIN XIMING</creatorcontrib><creatorcontrib>QIAO QINWANG</creatorcontrib><creatorcontrib>ZHAO JIAN</creatorcontrib><creatorcontrib>LU ZHIPENG</creatorcontrib><creatorcontrib>FAN GUOHAO</creatorcontrib><title>Automatic quality inspection rule configuration method and device based on rule and semantic analysis</title><description>The invention discloses a quality inspection rule automatic configuration method and device based on rule and semantic analysis. The method comprises the steps that data element result information is acquired; performing keyword matching and entity recognition on the obtained data element result field name information to preliminarily detect first field information needing independent quality inspection; the value of the first field information needing independent quality inspection is judged to determine the type and the feature of the first field information; according to the type and the feature of the first field information, identifying second field information needing independent quality inspection in a data element result by using a pre-constructed tree model; based on the identified field information item of the second field information, determining a bid falling permission corresponding to the second field information; and configuring a corresponding quality inspection rule operator according to the</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDEKwkAQRbexEPUOkwNYJEHQMgTFyso-jLsTHdjMrpldIbeXiPZWH957_KWhJqcwYGILz4ye0wQsGskmDgJj9gQ2SM_3POIHDZQewQGKA0cvtgQ3VHLwq2ehNKDMlyjoJ2Vdm0WPXmnz3ZUpTsdre95SDB1pREtCqWsvZbmrqnJ_qJv6n-YNf9A_qw</recordid><startdate>20221021</startdate><enddate>20221021</enddate><creator>HU CHENGSHENG</creator><creator>ZHOU CHONGYI</creator><creator>WEN YANLONG</creator><creator>ZHENG XI</creator><creator>XIU XIN</creator><creator>ZHANG CHUNZI</creator><creator>ZHU LIFENG</creator><creator>LIU GUODONG</creator><creator>GUO LI</creator><creator>LIN XIMING</creator><creator>QIAO QINWANG</creator><creator>ZHAO JIAN</creator><creator>LU ZHIPENG</creator><creator>FAN GUOHAO</creator><scope>EVB</scope></search><sort><creationdate>20221021</creationdate><title>Automatic quality inspection rule configuration method and device based on rule and semantic analysis</title><author>HU CHENGSHENG ; ZHOU CHONGYI ; WEN YANLONG ; ZHENG XI ; XIU XIN ; ZHANG CHUNZI ; ZHU LIFENG ; LIU GUODONG ; GUO LI ; LIN XIMING ; QIAO QINWANG ; ZHAO JIAN ; LU ZHIPENG ; FAN GUOHAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115221893A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>HU CHENGSHENG</creatorcontrib><creatorcontrib>ZHOU CHONGYI</creatorcontrib><creatorcontrib>WEN YANLONG</creatorcontrib><creatorcontrib>ZHENG XI</creatorcontrib><creatorcontrib>XIU XIN</creatorcontrib><creatorcontrib>ZHANG CHUNZI</creatorcontrib><creatorcontrib>ZHU LIFENG</creatorcontrib><creatorcontrib>LIU GUODONG</creatorcontrib><creatorcontrib>GUO LI</creatorcontrib><creatorcontrib>LIN XIMING</creatorcontrib><creatorcontrib>QIAO QINWANG</creatorcontrib><creatorcontrib>ZHAO JIAN</creatorcontrib><creatorcontrib>LU ZHIPENG</creatorcontrib><creatorcontrib>FAN GUOHAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HU CHENGSHENG</au><au>ZHOU CHONGYI</au><au>WEN YANLONG</au><au>ZHENG XI</au><au>XIU XIN</au><au>ZHANG CHUNZI</au><au>ZHU LIFENG</au><au>LIU GUODONG</au><au>GUO LI</au><au>LIN XIMING</au><au>QIAO QINWANG</au><au>ZHAO JIAN</au><au>LU ZHIPENG</au><au>FAN GUOHAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic quality inspection rule configuration method and device based on rule and semantic analysis</title><date>2022-10-21</date><risdate>2022</risdate><abstract>The invention discloses a quality inspection rule automatic configuration method and device based on rule and semantic analysis. The method comprises the steps that data element result information is acquired; performing keyword matching and entity recognition on the obtained data element result field name information to preliminarily detect first field information needing independent quality inspection; the value of the first field information needing independent quality inspection is judged to determine the type and the feature of the first field information; according to the type and the feature of the first field information, identifying second field information needing independent quality inspection in a data element result by using a pre-constructed tree model; based on the identified field information item of the second field information, determining a bid falling permission corresponding to the second field information; and configuring a corresponding quality inspection rule operator according to the</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Automatic quality inspection rule configuration method and device based on rule and semantic analysis
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