Surface defect detection method based on deep learning algorithm

The invention discloses a surface defect detection method based on a deep learning algorithm, solves the problem of sample imbalance when surface defect detection is carried out by adopting the deep learning algorithm in the prior art, and belongs to the technical field of detection in industrial pr...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LIU GUODONG, LIAO JINGXIAO, GAO ZHUO, LIU BINGGUO, DONG HANGCHENG, HUANG YINGYAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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