Equipment life prediction method and device and constant-temperature acceleration test system
The embodiment of the invention provides an equipment life prediction method and device and a constant-temperature acceleration test system, and belongs to the technical field of equipment reliability prediction. The equipment service life prediction method comprises the following steps: acquiring a...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | CHEN YANNING YANG YOUNG-JONG TONG AOYU WANG LICHENG CHENG RUIQI ZHAO YANG |
| description | The embodiment of the invention provides an equipment life prediction method and device and a constant-temperature acceleration test system, and belongs to the technical field of equipment reliability prediction. The equipment service life prediction method comprises the following steps: acquiring an initial working temperature corresponding to an initial constant temperature and a first working temperature corresponding to a first constant temperature of each component on each circuit board card in equipment; based on the activation energy, the initial working temperature and the first working temperature of each component, the speed-up ratio of each component is determined; according to the speed-up ratio and the failure rate of each component, the speed-up ratio of the equipment is determined; and predicting the service life of the equipment according to the test duration from the time when the equipment is subjected to the constant-temperature acceleration test at the first constant temperature to the tim |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115186503A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115186503A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115186503A3</originalsourceid><addsrcrecordid>eNqNi0EKwjAURLNxIeod4gEKhlJxW0rFlSu3UkIyxUDyE5NfwdvbigdwNTO8N2tx75-TSwHE0rsRMmVYZ9hFkgH8iFZqstLi5Qy-1UQqrIkrRkjImqc8A2Pgl7H8GIVleZdZ2IrVqH3B7pcbsT_3t-5SIcUBJWkDAg_dValGnY7NoW7rf5wPUKk89A</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Equipment life prediction method and device and constant-temperature acceleration test system</title><source>esp@cenet</source><creator>CHEN YANNING ; YANG YOUNG-JONG ; TONG AOYU ; WANG LICHENG ; CHENG RUIQI ; ZHAO YANG</creator><creatorcontrib>CHEN YANNING ; YANG YOUNG-JONG ; TONG AOYU ; WANG LICHENG ; CHENG RUIQI ; ZHAO YANG</creatorcontrib><description>The embodiment of the invention provides an equipment life prediction method and device and a constant-temperature acceleration test system, and belongs to the technical field of equipment reliability prediction. The equipment service life prediction method comprises the following steps: acquiring an initial working temperature corresponding to an initial constant temperature and a first working temperature corresponding to a first constant temperature of each component on each circuit board card in equipment; based on the activation energy, the initial working temperature and the first working temperature of each component, the speed-up ratio of each component is determined; according to the speed-up ratio and the failure rate of each component, the speed-up ratio of the equipment is determined; and predicting the service life of the equipment according to the test duration from the time when the equipment is subjected to the constant-temperature acceleration test at the first constant temperature to the tim</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221014&DB=EPODOC&CC=CN&NR=115186503A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221014&DB=EPODOC&CC=CN&NR=115186503A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN YANNING</creatorcontrib><creatorcontrib>YANG YOUNG-JONG</creatorcontrib><creatorcontrib>TONG AOYU</creatorcontrib><creatorcontrib>WANG LICHENG</creatorcontrib><creatorcontrib>CHENG RUIQI</creatorcontrib><creatorcontrib>ZHAO YANG</creatorcontrib><title>Equipment life prediction method and device and constant-temperature acceleration test system</title><description>The embodiment of the invention provides an equipment life prediction method and device and a constant-temperature acceleration test system, and belongs to the technical field of equipment reliability prediction. The equipment service life prediction method comprises the following steps: acquiring an initial working temperature corresponding to an initial constant temperature and a first working temperature corresponding to a first constant temperature of each component on each circuit board card in equipment; based on the activation energy, the initial working temperature and the first working temperature of each component, the speed-up ratio of each component is determined; according to the speed-up ratio and the failure rate of each component, the speed-up ratio of the equipment is determined; and predicting the service life of the equipment according to the test duration from the time when the equipment is subjected to the constant-temperature acceleration test at the first constant temperature to the tim</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi0EKwjAURLNxIeod4gEKhlJxW0rFlSu3UkIyxUDyE5NfwdvbigdwNTO8N2tx75-TSwHE0rsRMmVYZ9hFkgH8iFZqstLi5Qy-1UQqrIkrRkjImqc8A2Pgl7H8GIVleZdZ2IrVqH3B7pcbsT_3t-5SIcUBJWkDAg_dValGnY7NoW7rf5wPUKk89A</recordid><startdate>20221014</startdate><enddate>20221014</enddate><creator>CHEN YANNING</creator><creator>YANG YOUNG-JONG</creator><creator>TONG AOYU</creator><creator>WANG LICHENG</creator><creator>CHENG RUIQI</creator><creator>ZHAO YANG</creator><scope>EVB</scope></search><sort><creationdate>20221014</creationdate><title>Equipment life prediction method and device and constant-temperature acceleration test system</title><author>CHEN YANNING ; YANG YOUNG-JONG ; TONG AOYU ; WANG LICHENG ; CHENG RUIQI ; ZHAO YANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115186503A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN YANNING</creatorcontrib><creatorcontrib>YANG YOUNG-JONG</creatorcontrib><creatorcontrib>TONG AOYU</creatorcontrib><creatorcontrib>WANG LICHENG</creatorcontrib><creatorcontrib>CHENG RUIQI</creatorcontrib><creatorcontrib>ZHAO YANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN YANNING</au><au>YANG YOUNG-JONG</au><au>TONG AOYU</au><au>WANG LICHENG</au><au>CHENG RUIQI</au><au>ZHAO YANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Equipment life prediction method and device and constant-temperature acceleration test system</title><date>2022-10-14</date><risdate>2022</risdate><abstract>The embodiment of the invention provides an equipment life prediction method and device and a constant-temperature acceleration test system, and belongs to the technical field of equipment reliability prediction. The equipment service life prediction method comprises the following steps: acquiring an initial working temperature corresponding to an initial constant temperature and a first working temperature corresponding to a first constant temperature of each component on each circuit board card in equipment; based on the activation energy, the initial working temperature and the first working temperature of each component, the speed-up ratio of each component is determined; according to the speed-up ratio and the failure rate of each component, the speed-up ratio of the equipment is determined; and predicting the service life of the equipment according to the test duration from the time when the equipment is subjected to the constant-temperature acceleration test at the first constant temperature to the tim</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN115186503A |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Equipment life prediction method and device and constant-temperature acceleration test system |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T22%3A34%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20YANNING&rft.date=2022-10-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN115186503A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |