Eddy current sensor response bandwidth testing device and method
The invention discloses an eddy current sensor response bandwidth testing device and method. The device comprises a response bandwidth testing module, an eddy current sensor, a sensor driving and conditioning module, a power supply module, a signal generation module and an output signal display modu...
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creator | NIU GUANGYUE ZHOU QI LI FANGYI ZHI FENGYAO JIANG JIAJIA DUAN FAJIE FU XIAO |
description | The invention discloses an eddy current sensor response bandwidth testing device and method. The device comprises a response bandwidth testing module, an eddy current sensor, a sensor driving and conditioning module, a power supply module, a signal generation module and an output signal display module. The response bandwidth test module is composed of an analog switch, a coil framework and a metal coil, the metal coil is wound on the coil framework, and two ends of the metal coil are respectively connected with the analog switch; one end of the response bandwidth test module is respectively connected with the power supply module and the signal generation module, the power supply module is used for supplying power to the response bandwidth test module, and the signal generation module is used for providing stable square wave signals for the response bandwidth test module; and the other end of the response bandwidth test module is connected with the eddy current sensor, the sensor driving and conditioning modul |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115183804A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115183804A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115183804A3</originalsourceid><addsrcrecordid>eNrjZHBwTUmpVEguLSpKzStRKE7NK84vUihKLS7IzytOVUhKzEspz0wpyVAoSS0uycxLV0hJLctMTlUAiivkppZk5KfwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_HigOYnJqXmpJfHOfoaGpoYWxhYGJo7GxKgBAPAWMY4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Eddy current sensor response bandwidth testing device and method</title><source>esp@cenet</source><creator>NIU GUANGYUE ; ZHOU QI ; LI FANGYI ; ZHI FENGYAO ; JIANG JIAJIA ; DUAN FAJIE ; FU XIAO</creator><creatorcontrib>NIU GUANGYUE ; ZHOU QI ; LI FANGYI ; ZHI FENGYAO ; JIANG JIAJIA ; DUAN FAJIE ; FU XIAO</creatorcontrib><description>The invention discloses an eddy current sensor response bandwidth testing device and method. The device comprises a response bandwidth testing module, an eddy current sensor, a sensor driving and conditioning module, a power supply module, a signal generation module and an output signal display module. The response bandwidth test module is composed of an analog switch, a coil framework and a metal coil, the metal coil is wound on the coil framework, and two ends of the metal coil are respectively connected with the analog switch; one end of the response bandwidth test module is respectively connected with the power supply module and the signal generation module, the power supply module is used for supplying power to the response bandwidth test module, and the signal generation module is used for providing stable square wave signals for the response bandwidth test module; and the other end of the response bandwidth test module is connected with the eddy current sensor, the sensor driving and conditioning modul</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221014&DB=EPODOC&CC=CN&NR=115183804A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221014&DB=EPODOC&CC=CN&NR=115183804A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NIU GUANGYUE</creatorcontrib><creatorcontrib>ZHOU QI</creatorcontrib><creatorcontrib>LI FANGYI</creatorcontrib><creatorcontrib>ZHI FENGYAO</creatorcontrib><creatorcontrib>JIANG JIAJIA</creatorcontrib><creatorcontrib>DUAN FAJIE</creatorcontrib><creatorcontrib>FU XIAO</creatorcontrib><title>Eddy current sensor response bandwidth testing device and method</title><description>The invention discloses an eddy current sensor response bandwidth testing device and method. The device comprises a response bandwidth testing module, an eddy current sensor, a sensor driving and conditioning module, a power supply module, a signal generation module and an output signal display module. The response bandwidth test module is composed of an analog switch, a coil framework and a metal coil, the metal coil is wound on the coil framework, and two ends of the metal coil are respectively connected with the analog switch; one end of the response bandwidth test module is respectively connected with the power supply module and the signal generation module, the power supply module is used for supplying power to the response bandwidth test module, and the signal generation module is used for providing stable square wave signals for the response bandwidth test module; and the other end of the response bandwidth test module is connected with the eddy current sensor, the sensor driving and conditioning modul</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHBwTUmpVEguLSpKzStRKE7NK84vUihKLS7IzytOVUhKzEspz0wpyVAoSS0uycxLV0hJLctMTlUAiivkppZk5KfwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_HigOYnJqXmpJfHOfoaGpoYWxhYGJo7GxKgBAPAWMY4</recordid><startdate>20221014</startdate><enddate>20221014</enddate><creator>NIU GUANGYUE</creator><creator>ZHOU QI</creator><creator>LI FANGYI</creator><creator>ZHI FENGYAO</creator><creator>JIANG JIAJIA</creator><creator>DUAN FAJIE</creator><creator>FU XIAO</creator><scope>EVB</scope></search><sort><creationdate>20221014</creationdate><title>Eddy current sensor response bandwidth testing device and method</title><author>NIU GUANGYUE ; ZHOU QI ; LI FANGYI ; ZHI FENGYAO ; JIANG JIAJIA ; DUAN FAJIE ; FU XIAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115183804A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NIU GUANGYUE</creatorcontrib><creatorcontrib>ZHOU QI</creatorcontrib><creatorcontrib>LI FANGYI</creatorcontrib><creatorcontrib>ZHI FENGYAO</creatorcontrib><creatorcontrib>JIANG JIAJIA</creatorcontrib><creatorcontrib>DUAN FAJIE</creatorcontrib><creatorcontrib>FU XIAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NIU GUANGYUE</au><au>ZHOU QI</au><au>LI FANGYI</au><au>ZHI FENGYAO</au><au>JIANG JIAJIA</au><au>DUAN FAJIE</au><au>FU XIAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Eddy current sensor response bandwidth testing device and method</title><date>2022-10-14</date><risdate>2022</risdate><abstract>The invention discloses an eddy current sensor response bandwidth testing device and method. The device comprises a response bandwidth testing module, an eddy current sensor, a sensor driving and conditioning module, a power supply module, a signal generation module and an output signal display module. The response bandwidth test module is composed of an analog switch, a coil framework and a metal coil, the metal coil is wound on the coil framework, and two ends of the metal coil are respectively connected with the analog switch; one end of the response bandwidth test module is respectively connected with the power supply module and the signal generation module, the power supply module is used for supplying power to the response bandwidth test module, and the signal generation module is used for providing stable square wave signals for the response bandwidth test module; and the other end of the response bandwidth test module is connected with the eddy current sensor, the sensor driving and conditioning modul</abstract><oa>free_for_read</oa></addata></record> |
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title | Eddy current sensor response bandwidth testing device and method |
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