Method for detecting depth of oxide layer in metal material

The invention relates to a method for detecting the depth of an oxide layer in a metal material. The method comprises the following steps: cutting a section on a sample to be measured; carrying out ion grinding treatment on the cross section; and observing the cross section subjected to the ion grin...

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Hauptverfasser: HUANG KAI, LI ZIYANG, ZUO XINLANG, LIU ZILIAN, ZHU GANG
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creator HUANG KAI
LI ZIYANG
ZUO XINLANG
LIU ZILIAN
ZHU GANG
description The invention relates to a method for detecting the depth of an oxide layer in a metal material. The method comprises the following steps: cutting a section on a sample to be measured; carrying out ion grinding treatment on the cross section; and observing the cross section subjected to the ion grinding treatment, and measuring the depth of the inner oxide layer. According to the method for detecting the depth of the oxide layer in the metal material, the cross section is cut on the sample to be measured and then subjected to ion grinding treatment, and due to the fact that the oxide layer and the non-oxide layer are different in mechanical property, after ion grinding treatment, the oxide layer and the non-oxide layer can form a height difference, and the depth of the oxide layer in the metal material can be detected. Therefore, the boundary between the inner oxide layer and the non-oxide layer is exposed, so that the inner oxidation depth of the metal material can be visually and accurately detected. The de
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115164745A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115164745A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115164745A3</originalsourceid><addsrcrecordid>eNrjZLD2TS3JyE9RSMsvUkhJLUlNLsnMSweyCkoyFPLTFPIrMlNSFXISK1OLFDLzFHJTSxJzFHITS1KLMhNzeBhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoaGpoZmJuYmpozExagB6Xi7-</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for detecting depth of oxide layer in metal material</title><source>esp@cenet</source><creator>HUANG KAI ; LI ZIYANG ; ZUO XINLANG ; LIU ZILIAN ; ZHU GANG</creator><creatorcontrib>HUANG KAI ; LI ZIYANG ; ZUO XINLANG ; LIU ZILIAN ; ZHU GANG</creatorcontrib><description>The invention relates to a method for detecting the depth of an oxide layer in a metal material. The method comprises the following steps: cutting a section on a sample to be measured; carrying out ion grinding treatment on the cross section; and observing the cross section subjected to the ion grinding treatment, and measuring the depth of the inner oxide layer. According to the method for detecting the depth of the oxide layer in the metal material, the cross section is cut on the sample to be measured and then subjected to ion grinding treatment, and due to the fact that the oxide layer and the non-oxide layer are different in mechanical property, after ion grinding treatment, the oxide layer and the non-oxide layer can form a height difference, and the depth of the oxide layer in the metal material can be detected. Therefore, the boundary between the inner oxide layer and the non-oxide layer is exposed, so that the inner oxidation depth of the metal material can be visually and accurately detected. The de</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221011&amp;DB=EPODOC&amp;CC=CN&amp;NR=115164745A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221011&amp;DB=EPODOC&amp;CC=CN&amp;NR=115164745A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG KAI</creatorcontrib><creatorcontrib>LI ZIYANG</creatorcontrib><creatorcontrib>ZUO XINLANG</creatorcontrib><creatorcontrib>LIU ZILIAN</creatorcontrib><creatorcontrib>ZHU GANG</creatorcontrib><title>Method for detecting depth of oxide layer in metal material</title><description>The invention relates to a method for detecting the depth of an oxide layer in a metal material. The method comprises the following steps: cutting a section on a sample to be measured; carrying out ion grinding treatment on the cross section; and observing the cross section subjected to the ion grinding treatment, and measuring the depth of the inner oxide layer. According to the method for detecting the depth of the oxide layer in the metal material, the cross section is cut on the sample to be measured and then subjected to ion grinding treatment, and due to the fact that the oxide layer and the non-oxide layer are different in mechanical property, after ion grinding treatment, the oxide layer and the non-oxide layer can form a height difference, and the depth of the oxide layer in the metal material can be detected. Therefore, the boundary between the inner oxide layer and the non-oxide layer is exposed, so that the inner oxidation depth of the metal material can be visually and accurately detected. The de</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD2TS3JyE9RSMsvUkhJLUlNLsnMSweyCkoyFPLTFPIrMlNSFXISK1OLFDLzFHJTSxJzFHITS1KLMhNzeBhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoaGpoZmJuYmpozExagB6Xi7-</recordid><startdate>20221011</startdate><enddate>20221011</enddate><creator>HUANG KAI</creator><creator>LI ZIYANG</creator><creator>ZUO XINLANG</creator><creator>LIU ZILIAN</creator><creator>ZHU GANG</creator><scope>EVB</scope></search><sort><creationdate>20221011</creationdate><title>Method for detecting depth of oxide layer in metal material</title><author>HUANG KAI ; LI ZIYANG ; ZUO XINLANG ; LIU ZILIAN ; ZHU GANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115164745A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG KAI</creatorcontrib><creatorcontrib>LI ZIYANG</creatorcontrib><creatorcontrib>ZUO XINLANG</creatorcontrib><creatorcontrib>LIU ZILIAN</creatorcontrib><creatorcontrib>ZHU GANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG KAI</au><au>LI ZIYANG</au><au>ZUO XINLANG</au><au>LIU ZILIAN</au><au>ZHU GANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for detecting depth of oxide layer in metal material</title><date>2022-10-11</date><risdate>2022</risdate><abstract>The invention relates to a method for detecting the depth of an oxide layer in a metal material. The method comprises the following steps: cutting a section on a sample to be measured; carrying out ion grinding treatment on the cross section; and observing the cross section subjected to the ion grinding treatment, and measuring the depth of the inner oxide layer. According to the method for detecting the depth of the oxide layer in the metal material, the cross section is cut on the sample to be measured and then subjected to ion grinding treatment, and due to the fact that the oxide layer and the non-oxide layer are different in mechanical property, after ion grinding treatment, the oxide layer and the non-oxide layer can form a height difference, and the depth of the oxide layer in the metal material can be detected. Therefore, the boundary between the inner oxide layer and the non-oxide layer is exposed, so that the inner oxidation depth of the metal material can be visually and accurately detected. The de</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Method for detecting depth of oxide layer in metal material
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T01%3A19%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HUANG%20KAI&rft.date=2022-10-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN115164745A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true