Overcurrent turn-off test method based on H-bridge test platform
The invention relates to an over-current turn-off test method based on an H-bridge type operation test platform, a test system comprises four bridge arm branches, a bridge arm 1, a bridge arm 3, a bridge arm 2 and a bridge arm 4 form a phase unit 1 and a phase unit 2 respectively, the middle points...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | LI JUAN SHAO ZHUKE ZHANG LIANGRU WANG ZHONGXU WANG LIANG DONG YUE CHANG ZHONGTING ZHU SHUAI ZHANG KUN |
| description | The invention relates to an over-current turn-off test method based on an H-bridge type operation test platform, a test system comprises four bridge arm branches, a bridge arm 1, a bridge arm 3, a bridge arm 2 and a bridge arm 4 form a phase unit 1 and a phase unit 2 respectively, the middle points of the two phases are connected through a load reactor, and each bridge arm is composed of an MMC valve and a bridge arm reactor. The two phase units have a common direct current end and are connected with a direct current power supply through a smoothing reactor, and the direct current power supply is used for pre-charging the sub-module and supplementing active loss in the test process. According to the method, a target value control method is applied, the control logic of four bridge arm test objects is changed in the test operation process, the overcurrent turn-off test of the first bridge arm and the second bridge arm and the overcurrent turn-off test of the third bridge arm and the fourth bridge arm are compl |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115113028A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115113028A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115113028A3</originalsourceid><addsrcrecordid>eNrjZHDwL0stSi4tKkrNK1EoKS3K081PS1MoSS0uUchNLcnIT1FISixOTVHIz1Pw0E0qykxJT4XIFuQklqTlF-XyMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQ1NDQ2MDIwtHY2LUAAC7XTEH</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Overcurrent turn-off test method based on H-bridge test platform</title><source>esp@cenet</source><creator>LI JUAN ; SHAO ZHUKE ; ZHANG LIANGRU ; WANG ZHONGXU ; WANG LIANG ; DONG YUE ; CHANG ZHONGTING ; ZHU SHUAI ; ZHANG KUN</creator><creatorcontrib>LI JUAN ; SHAO ZHUKE ; ZHANG LIANGRU ; WANG ZHONGXU ; WANG LIANG ; DONG YUE ; CHANG ZHONGTING ; ZHU SHUAI ; ZHANG KUN</creatorcontrib><description>The invention relates to an over-current turn-off test method based on an H-bridge type operation test platform, a test system comprises four bridge arm branches, a bridge arm 1, a bridge arm 3, a bridge arm 2 and a bridge arm 4 form a phase unit 1 and a phase unit 2 respectively, the middle points of the two phases are connected through a load reactor, and each bridge arm is composed of an MMC valve and a bridge arm reactor. The two phase units have a common direct current end and are connected with a direct current power supply through a smoothing reactor, and the direct current power supply is used for pre-charging the sub-module and supplementing active loss in the test process. According to the method, a target value control method is applied, the control logic of four bridge arm test objects is changed in the test operation process, the overcurrent turn-off test of the first bridge arm and the second bridge arm and the overcurrent turn-off test of the third bridge arm and the fourth bridge arm are compl</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220927&DB=EPODOC&CC=CN&NR=115113028A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220927&DB=EPODOC&CC=CN&NR=115113028A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LI JUAN</creatorcontrib><creatorcontrib>SHAO ZHUKE</creatorcontrib><creatorcontrib>ZHANG LIANGRU</creatorcontrib><creatorcontrib>WANG ZHONGXU</creatorcontrib><creatorcontrib>WANG LIANG</creatorcontrib><creatorcontrib>DONG YUE</creatorcontrib><creatorcontrib>CHANG ZHONGTING</creatorcontrib><creatorcontrib>ZHU SHUAI</creatorcontrib><creatorcontrib>ZHANG KUN</creatorcontrib><title>Overcurrent turn-off test method based on H-bridge test platform</title><description>The invention relates to an over-current turn-off test method based on an H-bridge type operation test platform, a test system comprises four bridge arm branches, a bridge arm 1, a bridge arm 3, a bridge arm 2 and a bridge arm 4 form a phase unit 1 and a phase unit 2 respectively, the middle points of the two phases are connected through a load reactor, and each bridge arm is composed of an MMC valve and a bridge arm reactor. The two phase units have a common direct current end and are connected with a direct current power supply through a smoothing reactor, and the direct current power supply is used for pre-charging the sub-module and supplementing active loss in the test process. According to the method, a target value control method is applied, the control logic of four bridge arm test objects is changed in the test operation process, the overcurrent turn-off test of the first bridge arm and the second bridge arm and the overcurrent turn-off test of the third bridge arm and the fourth bridge arm are compl</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDwL0stSi4tKkrNK1EoKS3K081PS1MoSS0uUchNLcnIT1FISixOTVHIz1Pw0E0qykxJT4XIFuQklqTlF-XyMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQ1NDQ2MDIwtHY2LUAAC7XTEH</recordid><startdate>20220927</startdate><enddate>20220927</enddate><creator>LI JUAN</creator><creator>SHAO ZHUKE</creator><creator>ZHANG LIANGRU</creator><creator>WANG ZHONGXU</creator><creator>WANG LIANG</creator><creator>DONG YUE</creator><creator>CHANG ZHONGTING</creator><creator>ZHU SHUAI</creator><creator>ZHANG KUN</creator><scope>EVB</scope></search><sort><creationdate>20220927</creationdate><title>Overcurrent turn-off test method based on H-bridge test platform</title><author>LI JUAN ; SHAO ZHUKE ; ZHANG LIANGRU ; WANG ZHONGXU ; WANG LIANG ; DONG YUE ; CHANG ZHONGTING ; ZHU SHUAI ; ZHANG KUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115113028A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LI JUAN</creatorcontrib><creatorcontrib>SHAO ZHUKE</creatorcontrib><creatorcontrib>ZHANG LIANGRU</creatorcontrib><creatorcontrib>WANG ZHONGXU</creatorcontrib><creatorcontrib>WANG LIANG</creatorcontrib><creatorcontrib>DONG YUE</creatorcontrib><creatorcontrib>CHANG ZHONGTING</creatorcontrib><creatorcontrib>ZHU SHUAI</creatorcontrib><creatorcontrib>ZHANG KUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LI JUAN</au><au>SHAO ZHUKE</au><au>ZHANG LIANGRU</au><au>WANG ZHONGXU</au><au>WANG LIANG</au><au>DONG YUE</au><au>CHANG ZHONGTING</au><au>ZHU SHUAI</au><au>ZHANG KUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Overcurrent turn-off test method based on H-bridge test platform</title><date>2022-09-27</date><risdate>2022</risdate><abstract>The invention relates to an over-current turn-off test method based on an H-bridge type operation test platform, a test system comprises four bridge arm branches, a bridge arm 1, a bridge arm 3, a bridge arm 2 and a bridge arm 4 form a phase unit 1 and a phase unit 2 respectively, the middle points of the two phases are connected through a load reactor, and each bridge arm is composed of an MMC valve and a bridge arm reactor. The two phase units have a common direct current end and are connected with a direct current power supply through a smoothing reactor, and the direct current power supply is used for pre-charging the sub-module and supplementing active loss in the test process. According to the method, a target value control method is applied, the control logic of four bridge arm test objects is changed in the test operation process, the overcurrent turn-off test of the first bridge arm and the second bridge arm and the overcurrent turn-off test of the third bridge arm and the fourth bridge arm are compl</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN115113028A |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Overcurrent turn-off test method based on H-bridge test platform |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T00%3A03%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LI%20JUAN&rft.date=2022-09-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN115113028A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |