Chip automatic test method and system, computer equipment and storage medium

The invention is suitable for the technical field of computers, and provides an automatic chip testing method and system, computer equipment and a storage medium, and the method comprises the following steps: planning the motion track of a probe or an optical fiber or a chip bearing platform accordi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KUNG CHENGIH, KUANG SHIYIN, WAN YUANTAO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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