Chip automatic test method and system, computer equipment and storage medium
The invention is suitable for the technical field of computers, and provides an automatic chip testing method and system, computer equipment and a storage medium, and the method comprises the following steps: planning the motion track of a probe or an optical fiber or a chip bearing platform accordi...
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| creator | KUNG CHENGIH KUANG SHIYIN WAN YUANTAO |
| description | The invention is suitable for the technical field of computers, and provides an automatic chip testing method and system, computer equipment and a storage medium, and the method comprises the following steps: planning the motion track of a probe or an optical fiber or a chip bearing platform according to the distribution condition of a to-be-tested chip; testing the chip according to a set motion track and a test strategy, and outputting a test result; the test strategy is that a corresponding test program is called for a current to-be-tested chip for testing, and meanwhile image information of a next to-be-tested chip is obtained; identifying the acquired image information of the next to-be-tested chip, and judging whether the model of the next to-be-tested chip is the same as the model of the to-be-tested chip which is currently tested or not; the method has the advantages that mixed testing of products of different models can be achieved, the testing efficiency is greatly improved, and the cost is greatly |
| format | Patent |
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testing the chip according to a set motion track and a test strategy, and outputting a test result; the test strategy is that a corresponding test program is called for a current to-be-tested chip for testing, and meanwhile image information of a next to-be-tested chip is obtained; identifying the acquired image information of the next to-be-tested chip, and judging whether the model of the next to-be-tested chip is the same as the model of the to-be-tested chip which is currently tested or not; the method has the advantages that mixed testing of products of different models can be achieved, the testing efficiency is greatly improved, and the cost is greatly</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220909&DB=EPODOC&CC=CN&NR=115032523A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220909&DB=EPODOC&CC=CN&NR=115032523A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KUNG CHENGIH</creatorcontrib><creatorcontrib>KUANG SHIYIN</creatorcontrib><creatorcontrib>WAN YUANTAO</creatorcontrib><title>Chip automatic test method and system, computer equipment and storage medium</title><description>The invention is suitable for the technical field of computers, and provides an automatic chip testing method and system, computer equipment and a storage medium, and the method comprises the following steps: planning the motion track of a probe or an optical fiber or a chip bearing platform according to the distribution condition of a to-be-tested chip; 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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Chip automatic test method and system, computer equipment and storage medium |
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