Optical detection system and operation method thereof
An optical detection system is configured to detect a component under test having a first linear polarizer and a quarter-wave plate. The optical detection system comprises a light source, a polarization adjustment assembly and a detection unit. The light source has a light emitting surface and is co...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | ZHOU JIANGYUN YE ZHAOYI LIANG ZHEYUAN SHI HONGXIN |
description | An optical detection system is configured to detect a component under test having a first linear polarizer and a quarter-wave plate. The optical detection system comprises a light source, a polarization adjustment assembly and a detection unit. The light source has a light emitting surface and is configured to emit light. The polarized light adjusting assembly faces the light-emitting surface of the light source. The polarization adjustment assembly is configured to convert the light into linear polarized light. The first linear polarizer is located between the polarization adjusting assembly and the quarter-wave plate. The to-be-tested component is configured to convert the linearly polarized light into circularly polarized light. The detection unit is located on the side, back to the polarization adjustment assembly, of the to-be-detected assembly. The detection unit is configured to calculate a phase difference angle between an absorption axis of a first linear polarizer of the to-be-detected assembly and |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115031928A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115031928A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115031928A3</originalsourceid><addsrcrecordid>eNrjZDD1LyjJTE7MUUhJLUlNLsnMz1MoriwuSc1VSMxLUcgvSC1KBAvmppZk5KcolGSkFqXmp_EwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDUwNjQ0sjC0djYtQAAIwaLXo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Optical detection system and operation method thereof</title><source>esp@cenet</source><creator>ZHOU JIANGYUN ; YE ZHAOYI ; LIANG ZHEYUAN ; SHI HONGXIN</creator><creatorcontrib>ZHOU JIANGYUN ; YE ZHAOYI ; LIANG ZHEYUAN ; SHI HONGXIN</creatorcontrib><description>An optical detection system is configured to detect a component under test having a first linear polarizer and a quarter-wave plate. The optical detection system comprises a light source, a polarization adjustment assembly and a detection unit. The light source has a light emitting surface and is configured to emit light. The polarized light adjusting assembly faces the light-emitting surface of the light source. The polarization adjustment assembly is configured to convert the light into linear polarized light. The first linear polarizer is located between the polarization adjusting assembly and the quarter-wave plate. The to-be-tested component is configured to convert the linearly polarized light into circularly polarized light. The detection unit is located on the side, back to the polarization adjustment assembly, of the to-be-detected assembly. The detection unit is configured to calculate a phase difference angle between an absorption axis of a first linear polarizer of the to-be-detected assembly and</description><language>chi ; eng</language><subject>MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220909&DB=EPODOC&CC=CN&NR=115031928A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220909&DB=EPODOC&CC=CN&NR=115031928A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHOU JIANGYUN</creatorcontrib><creatorcontrib>YE ZHAOYI</creatorcontrib><creatorcontrib>LIANG ZHEYUAN</creatorcontrib><creatorcontrib>SHI HONGXIN</creatorcontrib><title>Optical detection system and operation method thereof</title><description>An optical detection system is configured to detect a component under test having a first linear polarizer and a quarter-wave plate. The optical detection system comprises a light source, a polarization adjustment assembly and a detection unit. The light source has a light emitting surface and is configured to emit light. The polarized light adjusting assembly faces the light-emitting surface of the light source. The polarization adjustment assembly is configured to convert the light into linear polarized light. The first linear polarizer is located between the polarization adjusting assembly and the quarter-wave plate. The to-be-tested component is configured to convert the linearly polarized light into circularly polarized light. The detection unit is located on the side, back to the polarization adjustment assembly, of the to-be-detected assembly. The detection unit is configured to calculate a phase difference angle between an absorption axis of a first linear polarizer of the to-be-detected assembly and</description><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD1LyjJTE7MUUhJLUlNLsnMz1MoriwuSc1VSMxLUcgvSC1KBAvmppZk5KcolGSkFqXmp_EwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDUwNjQ0sjC0djYtQAAIwaLXo</recordid><startdate>20220909</startdate><enddate>20220909</enddate><creator>ZHOU JIANGYUN</creator><creator>YE ZHAOYI</creator><creator>LIANG ZHEYUAN</creator><creator>SHI HONGXIN</creator><scope>EVB</scope></search><sort><creationdate>20220909</creationdate><title>Optical detection system and operation method thereof</title><author>ZHOU JIANGYUN ; YE ZHAOYI ; LIANG ZHEYUAN ; SHI HONGXIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115031928A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHOU JIANGYUN</creatorcontrib><creatorcontrib>YE ZHAOYI</creatorcontrib><creatorcontrib>LIANG ZHEYUAN</creatorcontrib><creatorcontrib>SHI HONGXIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHOU JIANGYUN</au><au>YE ZHAOYI</au><au>LIANG ZHEYUAN</au><au>SHI HONGXIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Optical detection system and operation method thereof</title><date>2022-09-09</date><risdate>2022</risdate><abstract>An optical detection system is configured to detect a component under test having a first linear polarizer and a quarter-wave plate. The optical detection system comprises a light source, a polarization adjustment assembly and a detection unit. The light source has a light emitting surface and is configured to emit light. The polarized light adjusting assembly faces the light-emitting surface of the light source. The polarization adjustment assembly is configured to convert the light into linear polarized light. The first linear polarizer is located between the polarization adjusting assembly and the quarter-wave plate. The to-be-tested component is configured to convert the linearly polarized light into circularly polarized light. The detection unit is located on the side, back to the polarization adjustment assembly, of the to-be-detected assembly. The detection unit is configured to calculate a phase difference angle between an absorption axis of a first linear polarizer of the to-be-detected assembly and</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN115031928A |
source | esp@cenet |
subjects | MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | Optical detection system and operation method thereof |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T03%3A56%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZHOU%20JIANGYUN&rft.date=2022-09-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN115031928A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |