Screen cabinet microenvironment safety control method and system
The invention discloses a screen cabinet microenvironment safety management and control method and system, and the system comprises a monitoring assembly which comprises a housing, and a sensor, a magnet, a first conductive block and a monitoring circuit which are disposed in the housing; the mounti...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | YANG ZHIHUA LONG ZOU LIAO YINGXI YIN ZHENCHAO LUO CHONGLI WU ZHENTIAN LV LINGZHI WEI RONGTAO WANG XIUZHU QIN FENGZHI LI SENLIN QIAN XIN |
| description | The invention discloses a screen cabinet microenvironment safety management and control method and system, and the system comprises a monitoring assembly which comprises a housing, and a sensor, a magnet, a first conductive block and a monitoring circuit which are disposed in the housing; the mounting assembly is arranged on the screen cabinet and comprises a response circuit and a response part; according to the invention, historical data are collected to establish a cable life prediction model, current data are sensed and monitored by using a CT electricity taking technology, the surface temperature of the cable is monitored in real time by using a patch temperature sensor to carry out multi-point deployment, and the insulation state of the cable is detected by using a spectrum analysis device, so that whether an arc light phenomenon occurs can be judged; real-time monitoring and data recording of the working microenvironment in the screen cabinet are achieved, the cable working state grade is input into th |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115014578A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115014578A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115014578A3</originalsourceid><addsrcrecordid>eNrjZHAITi5KTc1TSE5MysxLLVHIzUwuyk_NK8ssys_LTc0rUShOTEstqVRIzs8rKcrPUchNLcnIT1FIzEtRKK4sLknN5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpQHPjnf0MDU0NDE1MzS0cjYlRAwAZVTHy</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Screen cabinet microenvironment safety control method and system</title><source>esp@cenet</source><creator>YANG ZHIHUA ; LONG ZOU ; LIAO YINGXI ; YIN ZHENCHAO ; LUO CHONGLI ; WU ZHENTIAN ; LV LINGZHI ; WEI RONGTAO ; WANG XIUZHU ; QIN FENGZHI ; LI SENLIN ; QIAN XIN</creator><creatorcontrib>YANG ZHIHUA ; LONG ZOU ; LIAO YINGXI ; YIN ZHENCHAO ; LUO CHONGLI ; WU ZHENTIAN ; LV LINGZHI ; WEI RONGTAO ; WANG XIUZHU ; QIN FENGZHI ; LI SENLIN ; QIAN XIN</creatorcontrib><description>The invention discloses a screen cabinet microenvironment safety management and control method and system, and the system comprises a monitoring assembly which comprises a housing, and a sensor, a magnet, a first conductive block and a monitoring circuit which are disposed in the housing; the mounting assembly is arranged on the screen cabinet and comprises a response circuit and a response part; according to the invention, historical data are collected to establish a cable life prediction model, current data are sensed and monitored by using a CT electricity taking technology, the surface temperature of the cable is monitored in real time by using a patch temperature sensor to carry out multi-point deployment, and the insulation state of the cable is detected by using a spectrum analysis device, so that whether an arc light phenomenon occurs can be judged; real-time monitoring and data recording of the working microenvironment in the screen cabinet are achieved, the cable working state grade is input into th</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220906&DB=EPODOC&CC=CN&NR=115014578A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220906&DB=EPODOC&CC=CN&NR=115014578A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YANG ZHIHUA</creatorcontrib><creatorcontrib>LONG ZOU</creatorcontrib><creatorcontrib>LIAO YINGXI</creatorcontrib><creatorcontrib>YIN ZHENCHAO</creatorcontrib><creatorcontrib>LUO CHONGLI</creatorcontrib><creatorcontrib>WU ZHENTIAN</creatorcontrib><creatorcontrib>LV LINGZHI</creatorcontrib><creatorcontrib>WEI RONGTAO</creatorcontrib><creatorcontrib>WANG XIUZHU</creatorcontrib><creatorcontrib>QIN FENGZHI</creatorcontrib><creatorcontrib>LI SENLIN</creatorcontrib><creatorcontrib>QIAN XIN</creatorcontrib><title>Screen cabinet microenvironment safety control method and system</title><description>The invention discloses a screen cabinet microenvironment safety management and control method and system, and the system comprises a monitoring assembly which comprises a housing, and a sensor, a magnet, a first conductive block and a monitoring circuit which are disposed in the housing; the mounting assembly is arranged on the screen cabinet and comprises a response circuit and a response part; according to the invention, historical data are collected to establish a cable life prediction model, current data are sensed and monitored by using a CT electricity taking technology, the surface temperature of the cable is monitored in real time by using a patch temperature sensor to carry out multi-point deployment, and the insulation state of the cable is detected by using a spectrum analysis device, so that whether an arc light phenomenon occurs can be judged; real-time monitoring and data recording of the working microenvironment in the screen cabinet are achieved, the cable working state grade is input into th</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAITi5KTc1TSE5MysxLLVHIzUwuyk_NK8ssys_LTc0rUShOTEstqVRIzs8rKcrPUchNLcnIT1FIzEtRKK4sLknN5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpQHPjnf0MDU0NDE1MzS0cjYlRAwAZVTHy</recordid><startdate>20220906</startdate><enddate>20220906</enddate><creator>YANG ZHIHUA</creator><creator>LONG ZOU</creator><creator>LIAO YINGXI</creator><creator>YIN ZHENCHAO</creator><creator>LUO CHONGLI</creator><creator>WU ZHENTIAN</creator><creator>LV LINGZHI</creator><creator>WEI RONGTAO</creator><creator>WANG XIUZHU</creator><creator>QIN FENGZHI</creator><creator>LI SENLIN</creator><creator>QIAN XIN</creator><scope>EVB</scope></search><sort><creationdate>20220906</creationdate><title>Screen cabinet microenvironment safety control method and system</title><author>YANG ZHIHUA ; LONG ZOU ; LIAO YINGXI ; YIN ZHENCHAO ; LUO CHONGLI ; WU ZHENTIAN ; LV LINGZHI ; WEI RONGTAO ; WANG XIUZHU ; QIN FENGZHI ; LI SENLIN ; QIAN XIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115014578A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>YANG ZHIHUA</creatorcontrib><creatorcontrib>LONG ZOU</creatorcontrib><creatorcontrib>LIAO YINGXI</creatorcontrib><creatorcontrib>YIN ZHENCHAO</creatorcontrib><creatorcontrib>LUO CHONGLI</creatorcontrib><creatorcontrib>WU ZHENTIAN</creatorcontrib><creatorcontrib>LV LINGZHI</creatorcontrib><creatorcontrib>WEI RONGTAO</creatorcontrib><creatorcontrib>WANG XIUZHU</creatorcontrib><creatorcontrib>QIN FENGZHI</creatorcontrib><creatorcontrib>LI SENLIN</creatorcontrib><creatorcontrib>QIAN XIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YANG ZHIHUA</au><au>LONG ZOU</au><au>LIAO YINGXI</au><au>YIN ZHENCHAO</au><au>LUO CHONGLI</au><au>WU ZHENTIAN</au><au>LV LINGZHI</au><au>WEI RONGTAO</au><au>WANG XIUZHU</au><au>QIN FENGZHI</au><au>LI SENLIN</au><au>QIAN XIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Screen cabinet microenvironment safety control method and system</title><date>2022-09-06</date><risdate>2022</risdate><abstract>The invention discloses a screen cabinet microenvironment safety management and control method and system, and the system comprises a monitoring assembly which comprises a housing, and a sensor, a magnet, a first conductive block and a monitoring circuit which are disposed in the housing; the mounting assembly is arranged on the screen cabinet and comprises a response circuit and a response part; according to the invention, historical data are collected to establish a cable life prediction model, current data are sensed and monitored by using a CT electricity taking technology, the surface temperature of the cable is monitored in real time by using a patch temperature sensor to carry out multi-point deployment, and the insulation state of the cable is detected by using a spectrum analysis device, so that whether an arc light phenomenon occurs can be judged; real-time monitoring and data recording of the working microenvironment in the screen cabinet are achieved, the cable working state grade is input into th</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN115014578A |
| source | esp@cenet |
| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TARIFF METERING APPARATUS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
| title | Screen cabinet microenvironment safety control method and system |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T00%3A02%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YANG%20ZHIHUA&rft.date=2022-09-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN115014578A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |