High-precision current sampling circuit and method with nearly lossless interior of chip

The invention provides a high-precision current sampling circuit and method with the interior of a chip close to be lossless. The circuit comprises a metal sampling resistor Rsample, a switch sw1, a switch sw2, a trimming resistor Rt1, a trimming resistor Rt2, a resistor Rt, an operational amplifier...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG JIANPING, REN CAIHUA, LIANG ENZHU
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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