Method for measuring thickness of surface film of steel plate
The invention discloses a method for measuring the thickness of a surface film of a steel plate, which comprises the following steps of: 1, adjusting various indexes of a goniometer, driving a z axis of the goniometer, and adjusting a to-be-measured surface of a sample to an axis plane of the goniom...
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| creator | XIONG LI LI JIE LEE JANG IL YAN GAOLIN CHENG ZHIMIN KOU YONGYONG |
| description | The invention discloses a method for measuring the thickness of a surface film of a steel plate, which comprises the following steps of: 1, adjusting various indexes of a goniometer, driving a z axis of the goniometer, and adjusting a to-be-measured surface of a sample to an axis plane of the goniometer; step 2, selecting a diffraction peak {hkl} of the matrix, measuring diffraction intensity I of the diffraction peak {hkl} at different positions S on the z-axis at a diffraction ray focus and near the diffraction ray focus by taking the zero point of the z-axis as a starting point, and determining a diffraction intensity I-S curve; 3, S corresponding to the peak value of the I-S curve is determined, and therefore the thickness of the to-be-measured sample thin film is measured. According to the method, the thickness of the surface film of the steel plate substrate is measured by using an x-ray diffractometer, an x-ray stress meter and other instruments, the precession function of a z-axis on an objective tabl |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN114993216A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN114993216A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN114993216A3</originalsourceid><addsrcrecordid>eNrjZLD1TS3JyE9RSMsvUshNTSwuLcrMS1coychMzs5LLS5WyE9TAIqlJSanKqRl5uSC-SWpqTkKBTmJJak8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uACoLS-1JN7Zz9DQxNLS2MjQzNGYGDUACwEv-Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for measuring thickness of surface film of steel plate</title><source>esp@cenet</source><creator>XIONG LI ; LI JIE ; LEE JANG IL ; YAN GAOLIN ; CHENG ZHIMIN ; KOU YONGYONG</creator><creatorcontrib>XIONG LI ; LI JIE ; LEE JANG IL ; YAN GAOLIN ; CHENG ZHIMIN ; KOU YONGYONG</creatorcontrib><description>The invention discloses a method for measuring the thickness of a surface film of a steel plate, which comprises the following steps of: 1, adjusting various indexes of a goniometer, driving a z axis of the goniometer, and adjusting a to-be-measured surface of a sample to an axis plane of the goniometer; step 2, selecting a diffraction peak {hkl} of the matrix, measuring diffraction intensity I of the diffraction peak {hkl} at different positions S on the z-axis at a diffraction ray focus and near the diffraction ray focus by taking the zero point of the z-axis as a starting point, and determining a diffraction intensity I-S curve; 3, S corresponding to the peak value of the I-S curve is determined, and therefore the thickness of the to-be-measured sample thin film is measured. According to the method, the thickness of the surface film of the steel plate substrate is measured by using an x-ray diffractometer, an x-ray stress meter and other instruments, the precession function of a z-axis on an objective tabl</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220902&DB=EPODOC&CC=CN&NR=114993216A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220902&DB=EPODOC&CC=CN&NR=114993216A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XIONG LI</creatorcontrib><creatorcontrib>LI JIE</creatorcontrib><creatorcontrib>LEE JANG IL</creatorcontrib><creatorcontrib>YAN GAOLIN</creatorcontrib><creatorcontrib>CHENG ZHIMIN</creatorcontrib><creatorcontrib>KOU YONGYONG</creatorcontrib><title>Method for measuring thickness of surface film of steel plate</title><description>The invention discloses a method for measuring the thickness of a surface film of a steel plate, which comprises the following steps of: 1, adjusting various indexes of a goniometer, driving a z axis of the goniometer, and adjusting a to-be-measured surface of a sample to an axis plane of the goniometer; step 2, selecting a diffraction peak {hkl} of the matrix, measuring diffraction intensity I of the diffraction peak {hkl} at different positions S on the z-axis at a diffraction ray focus and near the diffraction ray focus by taking the zero point of the z-axis as a starting point, and determining a diffraction intensity I-S curve; 3, S corresponding to the peak value of the I-S curve is determined, and therefore the thickness of the to-be-measured sample thin film is measured. According to the method, the thickness of the surface film of the steel plate substrate is measured by using an x-ray diffractometer, an x-ray stress meter and other instruments, the precession function of a z-axis on an objective tabl</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD1TS3JyE9RSMsvUshNTSwuLcrMS1coychMzs5LLS5WyE9TAIqlJSanKqRl5uSC-SWpqTkKBTmJJak8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uACoLS-1JN7Zz9DQxNLS2MjQzNGYGDUACwEv-Q</recordid><startdate>20220902</startdate><enddate>20220902</enddate><creator>XIONG LI</creator><creator>LI JIE</creator><creator>LEE JANG IL</creator><creator>YAN GAOLIN</creator><creator>CHENG ZHIMIN</creator><creator>KOU YONGYONG</creator><scope>EVB</scope></search><sort><creationdate>20220902</creationdate><title>Method for measuring thickness of surface film of steel plate</title><author>XIONG LI ; LI JIE ; LEE JANG IL ; YAN GAOLIN ; CHENG ZHIMIN ; KOU YONGYONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114993216A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XIONG LI</creatorcontrib><creatorcontrib>LI JIE</creatorcontrib><creatorcontrib>LEE JANG IL</creatorcontrib><creatorcontrib>YAN GAOLIN</creatorcontrib><creatorcontrib>CHENG ZHIMIN</creatorcontrib><creatorcontrib>KOU YONGYONG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XIONG LI</au><au>LI JIE</au><au>LEE JANG IL</au><au>YAN GAOLIN</au><au>CHENG ZHIMIN</au><au>KOU YONGYONG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for measuring thickness of surface film of steel plate</title><date>2022-09-02</date><risdate>2022</risdate><abstract>The invention discloses a method for measuring the thickness of a surface film of a steel plate, which comprises the following steps of: 1, adjusting various indexes of a goniometer, driving a z axis of the goniometer, and adjusting a to-be-measured surface of a sample to an axis plane of the goniometer; step 2, selecting a diffraction peak {hkl} of the matrix, measuring diffraction intensity I of the diffraction peak {hkl} at different positions S on the z-axis at a diffraction ray focus and near the diffraction ray focus by taking the zero point of the z-axis as a starting point, and determining a diffraction intensity I-S curve; 3, S corresponding to the peak value of the I-S curve is determined, and therefore the thickness of the to-be-measured sample thin film is measured. According to the method, the thickness of the surface film of the steel plate substrate is measured by using an x-ray diffractometer, an x-ray stress meter and other instruments, the precession function of a z-axis on an objective tabl</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Method for measuring thickness of surface film of steel plate |
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