Background gas correction method based on ultraviolet infrared SF6 decomposed gas detection method

The invention discloses a background gas correction method based on an ultraviolet infrared SF6 decomposed gas detection method, and the method specifically comprises the following steps: S1, gas sampling: enabling a carrier gas to pass through a reference arm of a thermal conductivity detector, and...

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Hauptverfasser: LUO LANG, SHI WEIJUN, YANG XU, WU JUN, DONG XIAOHU, YANG FENGFAN, CHENG SHENG, YAO JINGSONG, ZHAO WEI, LIN LEI
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creator LUO LANG
SHI WEIJUN
YANG XU
WU JUN
DONG XIAOHU
YANG FENGFAN
CHENG SHENG
YAO JINGSONG
ZHAO WEI
LIN LEI
description The invention discloses a background gas correction method based on an ultraviolet infrared SF6 decomposed gas detection method, and the method specifically comprises the following steps: S1, gas sampling: enabling a carrier gas to pass through a reference arm of a thermal conductivity detector, and then mixing the carrier gas with an SF6 discharge decomposed gas to form a test gas; s2, scanning identification: scanning the components of the typical sample of the SF6 decomposed gas by utilizing traceable equipment to obtain and record the component and concentration data of the SF6 decomposed gas; all the full-spectrum data is screened by using an ant colony algorithm to obtain effective spectrum data, and the invention relates to the technical field of SF6 decomposed gas detection. According to the background gas correction method based on the ultraviolet infrared SF6 decomposed gas detection method, the problems of inaccurate measurement (interference and drifting), frequent replacement of an electrochemica
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Background gas correction method based on ultraviolet infrared SF6 decomposed gas detection method
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