Preparation method of hundred-micron transmission electron microscope sample

Preparation method of hundred-micron transmission electron microscope sample

The invention provides a preparation method of a hundred-micron transmission electron microscope sample. The method specifically comprises the following steps: (1) depositing a carbide protective layer, and cutting a hundred-micron sheet sample; (2) depositing platinum carbide in a gap between the s...

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Hauptverfasser: SHEN HUAHAI, ZOU CHENGQIN, ZHOU XIAOSONG, LI MUHONG
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator SHEN HUAHAI
ZOU CHENGQIN
ZHOU XIAOSONG
LI MUHONG
description The invention provides a preparation method of a hundred-micron transmission electron microscope sample. The method specifically comprises the following steps: (1) depositing a carbide protective layer, and cutting a hundred-micron sheet sample; (2) depositing platinum carbide in a gap between the sample transfer needle and the top of the sheet sample to complete adhesion of the sheet sample; (3) moving the sheet sample to the top of the microcolumn, and depositing platinum carbide between the sheet sample and the microcolumn to complete fixation of the sheet sample; and (4) thinning partial areas on the front side and the rear side of the slice sample, and reserving areas in certain width ranges of the left side, the right side and the bottom of the slice sample as non-thinned areas, so as to obtain the hundred-micron transmission electron microscope sample. The method not only overcomes the defect that a large-size transmission electron microscope sample is easy to bend, curl or damage, but also realizes th
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Preparation method of hundred-micron transmission electron microscope sample
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