Resolution test chart and resolution test method of wide-angle lens
The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagon...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | CHEN BAIZHOU KE JUNCHENG |
description | The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagonal line which are intersected at the central point; the first pattern and the second pattern are arranged around the central point and are located on the first virtual diagonal line and the second virtual diagonal line; the second pattern is provided with a first point, a second point, a third point and a fourth point, and the first point, the third point, the second point and the fourth point are sequentially connected through curves. According to the resolution test chart and the resolution test method of the wide-angle lens, the test area, the first pattern and the second pattern are designed, so that the pattern style in the test image obtained by the wide-angle lens is ensured to be unchanged when the resoluti |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN114910251A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN114910251A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN114910251A3</originalsourceid><addsrcrecordid>eNrjZHAOSi3OzyktyczPUyhJLS5RSM5ILCpRSMxLUShCk8lNLcnIT1HIT1Moz0xJ1U3MS89JVchJzSvmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhiaWhgZGpoaOxsSoAQCNYzJs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Resolution test chart and resolution test method of wide-angle lens</title><source>esp@cenet</source><creator>CHEN BAIZHOU ; KE JUNCHENG</creator><creatorcontrib>CHEN BAIZHOU ; KE JUNCHENG</creatorcontrib><description>The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagonal line which are intersected at the central point; the first pattern and the second pattern are arranged around the central point and are located on the first virtual diagonal line and the second virtual diagonal line; the second pattern is provided with a first point, a second point, a third point and a fourth point, and the first point, the third point, the second point and the fourth point are sequentially connected through curves. According to the resolution test chart and the resolution test method of the wide-angle lens, the test area, the first pattern and the second pattern are designed, so that the pattern style in the test image obtained by the wide-angle lens is ensured to be unchanged when the resoluti</description><language>chi ; eng</language><subject>MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220816&DB=EPODOC&CC=CN&NR=114910251A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220816&DB=EPODOC&CC=CN&NR=114910251A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN BAIZHOU</creatorcontrib><creatorcontrib>KE JUNCHENG</creatorcontrib><title>Resolution test chart and resolution test method of wide-angle lens</title><description>The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagonal line which are intersected at the central point; the first pattern and the second pattern are arranged around the central point and are located on the first virtual diagonal line and the second virtual diagonal line; the second pattern is provided with a first point, a second point, a third point and a fourth point, and the first point, the third point, the second point and the fourth point are sequentially connected through curves. According to the resolution test chart and the resolution test method of the wide-angle lens, the test area, the first pattern and the second pattern are designed, so that the pattern style in the test image obtained by the wide-angle lens is ensured to be unchanged when the resoluti</description><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAOSi3OzyktyczPUyhJLS5RSM5ILCpRSMxLUShCk8lNLcnIT1HIT1Moz0xJ1U3MS89JVchJzSvmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhiaWhgZGpoaOxsSoAQCNYzJs</recordid><startdate>20220816</startdate><enddate>20220816</enddate><creator>CHEN BAIZHOU</creator><creator>KE JUNCHENG</creator><scope>EVB</scope></search><sort><creationdate>20220816</creationdate><title>Resolution test chart and resolution test method of wide-angle lens</title><author>CHEN BAIZHOU ; KE JUNCHENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114910251A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN BAIZHOU</creatorcontrib><creatorcontrib>KE JUNCHENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN BAIZHOU</au><au>KE JUNCHENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Resolution test chart and resolution test method of wide-angle lens</title><date>2022-08-16</date><risdate>2022</risdate><abstract>The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagonal line which are intersected at the central point; the first pattern and the second pattern are arranged around the central point and are located on the first virtual diagonal line and the second virtual diagonal line; the second pattern is provided with a first point, a second point, a third point and a fourth point, and the first point, the third point, the second point and the fourth point are sequentially connected through curves. According to the resolution test chart and the resolution test method of the wide-angle lens, the test area, the first pattern and the second pattern are designed, so that the pattern style in the test image obtained by the wide-angle lens is ensured to be unchanged when the resoluti</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN114910251A |
source | esp@cenet |
subjects | MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | Resolution test chart and resolution test method of wide-angle lens |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T14%3A59%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20BAIZHOU&rft.date=2022-08-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN114910251A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |