Resolution test chart and resolution test method of wide-angle lens

The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagon...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CHEN BAIZHOU, KE JUNCHENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CHEN BAIZHOU
KE JUNCHENG
description The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagonal line which are intersected at the central point; the first pattern and the second pattern are arranged around the central point and are located on the first virtual diagonal line and the second virtual diagonal line; the second pattern is provided with a first point, a second point, a third point and a fourth point, and the first point, the third point, the second point and the fourth point are sequentially connected through curves. According to the resolution test chart and the resolution test method of the wide-angle lens, the test area, the first pattern and the second pattern are designed, so that the pattern style in the test image obtained by the wide-angle lens is ensured to be unchanged when the resoluti
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN114910251A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN114910251A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN114910251A3</originalsourceid><addsrcrecordid>eNrjZHAOSi3OzyktyczPUyhJLS5RSM5ILCpRSMxLUShCk8lNLcnIT1HIT1Moz0xJ1U3MS89JVchJzSvmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhiaWhgZGpoaOxsSoAQCNYzJs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Resolution test chart and resolution test method of wide-angle lens</title><source>esp@cenet</source><creator>CHEN BAIZHOU ; KE JUNCHENG</creator><creatorcontrib>CHEN BAIZHOU ; KE JUNCHENG</creatorcontrib><description>The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagonal line which are intersected at the central point; the first pattern and the second pattern are arranged around the central point and are located on the first virtual diagonal line and the second virtual diagonal line; the second pattern is provided with a first point, a second point, a third point and a fourth point, and the first point, the third point, the second point and the fourth point are sequentially connected through curves. According to the resolution test chart and the resolution test method of the wide-angle lens, the test area, the first pattern and the second pattern are designed, so that the pattern style in the test image obtained by the wide-angle lens is ensured to be unchanged when the resoluti</description><language>chi ; eng</language><subject>MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220816&amp;DB=EPODOC&amp;CC=CN&amp;NR=114910251A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220816&amp;DB=EPODOC&amp;CC=CN&amp;NR=114910251A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN BAIZHOU</creatorcontrib><creatorcontrib>KE JUNCHENG</creatorcontrib><title>Resolution test chart and resolution test method of wide-angle lens</title><description>The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagonal line which are intersected at the central point; the first pattern and the second pattern are arranged around the central point and are located on the first virtual diagonal line and the second virtual diagonal line; the second pattern is provided with a first point, a second point, a third point and a fourth point, and the first point, the third point, the second point and the fourth point are sequentially connected through curves. According to the resolution test chart and the resolution test method of the wide-angle lens, the test area, the first pattern and the second pattern are designed, so that the pattern style in the test image obtained by the wide-angle lens is ensured to be unchanged when the resoluti</description><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAOSi3OzyktyczPUyhJLS5RSM5ILCpRSMxLUShCk8lNLcnIT1HIT1Moz0xJ1U3MS89JVchJzSvmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhiaWhgZGpoaOxsSoAQCNYzJs</recordid><startdate>20220816</startdate><enddate>20220816</enddate><creator>CHEN BAIZHOU</creator><creator>KE JUNCHENG</creator><scope>EVB</scope></search><sort><creationdate>20220816</creationdate><title>Resolution test chart and resolution test method of wide-angle lens</title><author>CHEN BAIZHOU ; KE JUNCHENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114910251A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN BAIZHOU</creatorcontrib><creatorcontrib>KE JUNCHENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN BAIZHOU</au><au>KE JUNCHENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Resolution test chart and resolution test method of wide-angle lens</title><date>2022-08-16</date><risdate>2022</risdate><abstract>The invention discloses a resolution test chart and a resolution test method of a wide-angle lens. The resolution test chart card comprises a test area, a first pattern and a second pattern. The test area is provided with a central point, and a first virtual diagonal line and a second virtual diagonal line which are intersected at the central point; the first pattern and the second pattern are arranged around the central point and are located on the first virtual diagonal line and the second virtual diagonal line; the second pattern is provided with a first point, a second point, a third point and a fourth point, and the first point, the third point, the second point and the fourth point are sequentially connected through curves. According to the resolution test chart and the resolution test method of the wide-angle lens, the test area, the first pattern and the second pattern are designed, so that the pattern style in the test image obtained by the wide-angle lens is ensured to be unchanged when the resoluti</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN114910251A
source esp@cenet
subjects MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title Resolution test chart and resolution test method of wide-angle lens
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T14%3A59%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20BAIZHOU&rft.date=2022-08-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN114910251A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true