Data acquisition method and data acquisition unit
The invention discloses a data acquisition method. The method comprises the following steps: step 1, acquiring a plurality of groups of simulation data samples in the same time period; step 2, converting the collected analog data sample into an oscillogram; step 3, scanning each oscillogram, retaini...
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creator | XIE YAHUI LUO YONGHUA LUO CAILANG ZHANG SIMAO |
description | The invention discloses a data acquisition method. The method comprises the following steps: step 1, acquiring a plurality of groups of simulation data samples in the same time period; step 2, converting the collected analog data sample into an oscillogram; step 3, scanning each oscillogram, retaining a part of waveforms located at the lower part, and erasing other waveforms to generate a sample waveform; step 4, generating a to-be-measured oscillogram by using the collected data; and step 5, comparing the to-be-measured oscillogram with the sample oscillogram to obtain an acquisition result. A data collector comprises a main control unit, the main control unit is connected with a memory, and the main control unit receives data collected by an external sensor, arranges and analyzes the data to obtain a data sample, and stores the obtained data sample in the memory to wait for calling. A plurality of same-period data are collected, and the sample precision is improved by adopting the modes of area coverage and |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN114894239A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN114894239A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN114894239A3</originalsourceid><addsrcrecordid>eNrjZDB0SSxJVEhMLizNLM4syczPU8hNLcnIT1FIzEtRSEGXK83LLOFhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGJhaWJkbGlo7GxKgBAJUOK8Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Data acquisition method and data acquisition unit</title><source>esp@cenet</source><creator>XIE YAHUI ; LUO YONGHUA ; LUO CAILANG ; ZHANG SIMAO</creator><creatorcontrib>XIE YAHUI ; LUO YONGHUA ; LUO CAILANG ; ZHANG SIMAO</creatorcontrib><description>The invention discloses a data acquisition method. The method comprises the following steps: step 1, acquiring a plurality of groups of simulation data samples in the same time period; step 2, converting the collected analog data sample into an oscillogram; step 3, scanning each oscillogram, retaining a part of waveforms located at the lower part, and erasing other waveforms to generate a sample waveform; step 4, generating a to-be-measured oscillogram by using the collected data; and step 5, comparing the to-be-measured oscillogram with the sample oscillogram to obtain an acquisition result. A data collector comprises a main control unit, the main control unit is connected with a memory, and the main control unit receives data collected by an external sensor, arranges and analyzes the data to obtain a data sample, and stores the obtained data sample in the memory to wait for calling. A plurality of same-period data are collected, and the sample precision is improved by adopting the modes of area coverage and</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220812&DB=EPODOC&CC=CN&NR=114894239A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220812&DB=EPODOC&CC=CN&NR=114894239A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XIE YAHUI</creatorcontrib><creatorcontrib>LUO YONGHUA</creatorcontrib><creatorcontrib>LUO CAILANG</creatorcontrib><creatorcontrib>ZHANG SIMAO</creatorcontrib><title>Data acquisition method and data acquisition unit</title><description>The invention discloses a data acquisition method. The method comprises the following steps: step 1, acquiring a plurality of groups of simulation data samples in the same time period; step 2, converting the collected analog data sample into an oscillogram; step 3, scanning each oscillogram, retaining a part of waveforms located at the lower part, and erasing other waveforms to generate a sample waveform; step 4, generating a to-be-measured oscillogram by using the collected data; and step 5, comparing the to-be-measured oscillogram with the sample oscillogram to obtain an acquisition result. A data collector comprises a main control unit, the main control unit is connected with a memory, and the main control unit receives data collected by an external sensor, arranges and analyzes the data to obtain a data sample, and stores the obtained data sample in the memory to wait for calling. A plurality of same-period data are collected, and the sample precision is improved by adopting the modes of area coverage and</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB0SSxJVEhMLizNLM4syczPU8hNLcnIT1FIzEtRSEGXK83LLOFhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGJhaWJkbGlo7GxKgBAJUOK8Q</recordid><startdate>20220812</startdate><enddate>20220812</enddate><creator>XIE YAHUI</creator><creator>LUO YONGHUA</creator><creator>LUO CAILANG</creator><creator>ZHANG SIMAO</creator><scope>EVB</scope></search><sort><creationdate>20220812</creationdate><title>Data acquisition method and data acquisition unit</title><author>XIE YAHUI ; LUO YONGHUA ; LUO CAILANG ; ZHANG SIMAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114894239A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XIE YAHUI</creatorcontrib><creatorcontrib>LUO YONGHUA</creatorcontrib><creatorcontrib>LUO CAILANG</creatorcontrib><creatorcontrib>ZHANG SIMAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XIE YAHUI</au><au>LUO YONGHUA</au><au>LUO CAILANG</au><au>ZHANG SIMAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Data acquisition method and data acquisition unit</title><date>2022-08-12</date><risdate>2022</risdate><abstract>The invention discloses a data acquisition method. The method comprises the following steps: step 1, acquiring a plurality of groups of simulation data samples in the same time period; step 2, converting the collected analog data sample into an oscillogram; step 3, scanning each oscillogram, retaining a part of waveforms located at the lower part, and erasing other waveforms to generate a sample waveform; step 4, generating a to-be-measured oscillogram by using the collected data; and step 5, comparing the to-be-measured oscillogram with the sample oscillogram to obtain an acquisition result. A data collector comprises a main control unit, the main control unit is connected with a memory, and the main control unit receives data collected by an external sensor, arranges and analyzes the data to obtain a data sample, and stores the obtained data sample in the memory to wait for calling. A plurality of same-period data are collected, and the sample precision is improved by adopting the modes of area coverage and</abstract><oa>free_for_read</oa></addata></record> |
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subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TARIFF METERING APPARATUS TESTING |
title | Data acquisition method and data acquisition unit |
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