Substrate processing apparatus

The present invention relates to a substrate processing apparatus, comprising: a chamber providing a processing space; a cover member covering an upper portion of the chamber; a substrate supporting unit that supports at least one substrate and is rotatable about a rotation axis so that the substrat...

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Bibliographische Detailangaben
Hauptverfasser: BAEK IN-WOO, BYUN YOUNG-SUP, YEO INUL, KIM JONGOL
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The present invention relates to a substrate processing apparatus, comprising: a chamber providing a processing space; a cover member covering an upper portion of the chamber; a substrate supporting unit that supports at least one substrate and is rotatable about a rotation axis so that the substrate passes through the imaging region; a gas injection unit configured to inject a process gas toward the substrate supporting unit; a region photographing unit that photographs an image of the imaging region to obtain a thermal image of the imaging region; and a calculation unit that calculates temperature data of the substrate from the thermal image. 本发明关于一种基板处理设备,包含:腔室,提供处理空间;盖件,覆盖腔室的上部;基板支撑单元,支撑着至少一个基板且可绕旋转轴旋转,以使基板穿过成像区域;气体喷射单元,用于将处理气体喷向基板支撑单元;区域摄影单元,拍摄成像区域的图像以获得成像区域的热图像;以及计算单元,自热图像计算基板的温度数据。