Rapid test device suitable for valve tower and test method thereof
The invention relates to a rapid test device suitable for a valve tower and a test method thereof.The rapid test device comprises a box body, a direct-current power source, a switch I, a switch II, a resistor and a voltmeter, and the direct-current power source, the switch I, the switch II, the resi...
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| creator | CHEN XIUWEN MAO HUAQUAN WANG RUNTONG ZHAO HAIJIAO SUN QIUYAN HUANG YINGYING ZHUGE HONGPING HU YAJUN WANG HAO WANG XINGZHOU |
| description | The invention relates to a rapid test device suitable for a valve tower and a test method thereof.The rapid test device comprises a box body, a direct-current power source, a switch I, a switch II, a resistor and a voltmeter, and the direct-current power source, the switch I, the switch II, the resistor and the voltmeter are installed in the box body; the anode end of the charging circuit is connected with the input end of the charging loop of the valve tower as a leading-out end I, and the cathode end is connected with the output end of the valve tower as a leading-out end II; the voltmeter is connected in parallel with the DC power supply. One end of the discharge circuit is connected with the leading-out end II, and the other end of the discharge circuit serves as a leading-out end III to be connected with the input end of the discharge loop of the valve tower. According to the invention, the test of charging or discharging functions of all modules on the valve tower can be completed at one time, the test |
| format | Patent |
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One end of the discharge circuit is connected with the leading-out end II, and the other end of the discharge circuit serves as a leading-out end III to be connected with the input end of the discharge loop of the valve tower. According to the invention, the test of charging or discharging functions of all modules on the valve tower can be completed at one time, the test</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220708&DB=EPODOC&CC=CN&NR=114720800A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220708&DB=EPODOC&CC=CN&NR=114720800A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN XIUWEN</creatorcontrib><creatorcontrib>MAO HUAQUAN</creatorcontrib><creatorcontrib>WANG RUNTONG</creatorcontrib><creatorcontrib>ZHAO HAIJIAO</creatorcontrib><creatorcontrib>SUN QIUYAN</creatorcontrib><creatorcontrib>HUANG YINGYING</creatorcontrib><creatorcontrib>ZHUGE HONGPING</creatorcontrib><creatorcontrib>HU YAJUN</creatorcontrib><creatorcontrib>WANG HAO</creatorcontrib><creatorcontrib>WANG XINGZHOU</creatorcontrib><title>Rapid test device suitable for valve tower and test method thereof</title><description>The invention relates to a rapid test device suitable for a valve tower and a test method thereof.The rapid test device comprises a box body, a direct-current power source, a switch I, a switch II, a resistor and a voltmeter, and the direct-current power source, the switch I, the switch II, the resistor and the voltmeter are installed in the box body; the anode end of the charging circuit is connected with the input end of the charging loop of the valve tower as a leading-out end I, and the cathode end is connected with the output end of the valve tower as a leading-out end II; the voltmeter is connected in parallel with the DC power supply. One end of the discharge circuit is connected with the leading-out end II, and the other end of the discharge circuit serves as a leading-out end III to be connected with the input end of the discharge loop of the valve tower. According to the invention, the test of charging or discharging functions of all modules on the valve tower can be completed at one time, the test</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAKSizITFEoSS0uUUhJLctMTlUoLs0sSUzKSVVIyy9SKEvMKUtVKMkvTy1SSMyDKsxNLcnIB7IzUotS89N4GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakm8s5-hoYm5kYGFgYGjMTFqACHrMcc</recordid><startdate>20220708</startdate><enddate>20220708</enddate><creator>CHEN XIUWEN</creator><creator>MAO HUAQUAN</creator><creator>WANG RUNTONG</creator><creator>ZHAO HAIJIAO</creator><creator>SUN QIUYAN</creator><creator>HUANG YINGYING</creator><creator>ZHUGE HONGPING</creator><creator>HU YAJUN</creator><creator>WANG HAO</creator><creator>WANG XINGZHOU</creator><scope>EVB</scope></search><sort><creationdate>20220708</creationdate><title>Rapid test device suitable for valve tower and test method thereof</title><author>CHEN XIUWEN ; MAO HUAQUAN ; WANG RUNTONG ; ZHAO HAIJIAO ; SUN QIUYAN ; HUANG YINGYING ; ZHUGE HONGPING ; HU YAJUN ; WANG HAO ; WANG XINGZHOU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114720800A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN XIUWEN</creatorcontrib><creatorcontrib>MAO HUAQUAN</creatorcontrib><creatorcontrib>WANG RUNTONG</creatorcontrib><creatorcontrib>ZHAO HAIJIAO</creatorcontrib><creatorcontrib>SUN QIUYAN</creatorcontrib><creatorcontrib>HUANG YINGYING</creatorcontrib><creatorcontrib>ZHUGE HONGPING</creatorcontrib><creatorcontrib>HU YAJUN</creatorcontrib><creatorcontrib>WANG HAO</creatorcontrib><creatorcontrib>WANG XINGZHOU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN XIUWEN</au><au>MAO HUAQUAN</au><au>WANG RUNTONG</au><au>ZHAO HAIJIAO</au><au>SUN QIUYAN</au><au>HUANG YINGYING</au><au>ZHUGE HONGPING</au><au>HU YAJUN</au><au>WANG HAO</au><au>WANG XINGZHOU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Rapid test device suitable for valve tower and test method thereof</title><date>2022-07-08</date><risdate>2022</risdate><abstract>The invention relates to a rapid test device suitable for a valve tower and a test method thereof.The rapid test device comprises a box body, a direct-current power source, a switch I, a switch II, a resistor and a voltmeter, and the direct-current power source, the switch I, the switch II, the resistor and the voltmeter are installed in the box body; the anode end of the charging circuit is connected with the input end of the charging loop of the valve tower as a leading-out end I, and the cathode end is connected with the output end of the valve tower as a leading-out end II; the voltmeter is connected in parallel with the DC power supply. One end of the discharge circuit is connected with the leading-out end II, and the other end of the discharge circuit serves as a leading-out end III to be connected with the input end of the discharge loop of the valve tower. According to the invention, the test of charging or discharging functions of all modules on the valve tower can be completed at one time, the test</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Rapid test device suitable for valve tower and test method thereof |
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