Illumination system, lithography machine and illumination uniformity compensation method

The invention provides an illumination system, a photoetching machine and an illumination uniformity compensation method. The illumination unit is used for providing first illumination. The light uniformizing unit is used for uniformizing the first illumination and converting the first illumination...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TIAN YIQIANG, CHU ZHAOXIANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator TIAN YIQIANG
CHU ZHAOXIANG
description The invention provides an illumination system, a photoetching machine and an illumination uniformity compensation method. The illumination unit is used for providing first illumination. The light uniformizing unit is used for uniformizing the first illumination and converting the first illumination into second illumination. And the compensation unit comprises at least one optical flat plate with various light transmittances. The compensation unit can move in the direction identical to or opposite to the light propagation direction of the second illumination. And the second illumination passes through the optical flat plate to correspondingly form third illumination. The illumination uniformity of the third illumination is greater than that of the second illumination. Therefore, the light uniformizing effect of the light uniformizing unit is compensated by arranging the compensation unit with various light transmittances, so that the second illumination is adjusted by the compensation unit with different light
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN114690580A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN114690580A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN114690580A3</originalsourceid><addsrcrecordid>eNrjZIjwzMkpzc3MSyzJzM9TKK4sLknN1VHIySzJyE8vSizIqFTITUzOyMxLVUjMS1HIRFZcmpeZll-Um1lSqZCcn1uQmlcMEc9NBWpO4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoYmZpYGphYGjsbEqAEAVdM7uA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Illumination system, lithography machine and illumination uniformity compensation method</title><source>esp@cenet</source><creator>TIAN YIQIANG ; CHU ZHAOXIANG</creator><creatorcontrib>TIAN YIQIANG ; CHU ZHAOXIANG</creatorcontrib><description>The invention provides an illumination system, a photoetching machine and an illumination uniformity compensation method. The illumination unit is used for providing first illumination. The light uniformizing unit is used for uniformizing the first illumination and converting the first illumination into second illumination. And the compensation unit comprises at least one optical flat plate with various light transmittances. The compensation unit can move in the direction identical to or opposite to the light propagation direction of the second illumination. And the second illumination passes through the optical flat plate to correspondingly form third illumination. The illumination uniformity of the third illumination is greater than that of the second illumination. Therefore, the light uniformizing effect of the light uniformizing unit is compensated by arranging the compensation unit with various light transmittances, so that the second illumination is adjusted by the compensation unit with different light</description><language>chi ; eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220701&amp;DB=EPODOC&amp;CC=CN&amp;NR=114690580A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220701&amp;DB=EPODOC&amp;CC=CN&amp;NR=114690580A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TIAN YIQIANG</creatorcontrib><creatorcontrib>CHU ZHAOXIANG</creatorcontrib><title>Illumination system, lithography machine and illumination uniformity compensation method</title><description>The invention provides an illumination system, a photoetching machine and an illumination uniformity compensation method. The illumination unit is used for providing first illumination. The light uniformizing unit is used for uniformizing the first illumination and converting the first illumination into second illumination. And the compensation unit comprises at least one optical flat plate with various light transmittances. The compensation unit can move in the direction identical to or opposite to the light propagation direction of the second illumination. And the second illumination passes through the optical flat plate to correspondingly form third illumination. The illumination uniformity of the third illumination is greater than that of the second illumination. Therefore, the light uniformizing effect of the light uniformizing unit is compensated by arranging the compensation unit with various light transmittances, so that the second illumination is adjusted by the compensation unit with different light</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIjwzMkpzc3MSyzJzM9TKK4sLknN1VHIySzJyE8vSizIqFTITUzOyMxLVUjMS1HIRFZcmpeZll-Um1lSqZCcn1uQmlcMEc9NBWpO4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoYmZpYGphYGjsbEqAEAVdM7uA</recordid><startdate>20220701</startdate><enddate>20220701</enddate><creator>TIAN YIQIANG</creator><creator>CHU ZHAOXIANG</creator><scope>EVB</scope></search><sort><creationdate>20220701</creationdate><title>Illumination system, lithography machine and illumination uniformity compensation method</title><author>TIAN YIQIANG ; CHU ZHAOXIANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114690580A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>TIAN YIQIANG</creatorcontrib><creatorcontrib>CHU ZHAOXIANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TIAN YIQIANG</au><au>CHU ZHAOXIANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Illumination system, lithography machine and illumination uniformity compensation method</title><date>2022-07-01</date><risdate>2022</risdate><abstract>The invention provides an illumination system, a photoetching machine and an illumination uniformity compensation method. The illumination unit is used for providing first illumination. The light uniformizing unit is used for uniformizing the first illumination and converting the first illumination into second illumination. And the compensation unit comprises at least one optical flat plate with various light transmittances. The compensation unit can move in the direction identical to or opposite to the light propagation direction of the second illumination. And the second illumination passes through the optical flat plate to correspondingly form third illumination. The illumination uniformity of the third illumination is greater than that of the second illumination. Therefore, the light uniformizing effect of the light uniformizing unit is compensated by arranging the compensation unit with various light transmittances, so that the second illumination is adjusted by the compensation unit with different light</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN114690580A
source esp@cenet
subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
title Illumination system, lithography machine and illumination uniformity compensation method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T11%3A16%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TIAN%20YIQIANG&rft.date=2022-07-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN114690580A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true