Semiconductor device and method

Manufacturing processes and devices are provided in which a first opening is formed within a substrate. The first opening is remodeled to a second opening using a second etching process. The second etching process is performed using free radical etching, where the free radical etching utilizes neutr...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHANG ZHECHENG, WU BAIQI, YANG BAIFENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!