Processor automatic test control platform, control method and operation method

The invention relates to a processor automatic test control platform, a control method and an operation method, and the processor automatic test control platform comprises an upper computer and a chip function test board. The upper computer comprises processor full-function batch automatic test upper computer software controlled by a screen, debugger connection software C-SkyDebugServer and download debugging software CDK; the chip function test board comprises a single-chip microcomputer, a processor to be tested and an FPGA. The method can break through the memory limitation of the processor, realizes complex full-function batch automatic testing, effectively reduces the time cost, greatly improves the testing efficiency, can be popularized to other processors with limited memories, and has relatively high practicability. 一种处理器自动测试控制平台、控制方法及操作方法，其中，处理器自动测试控制平台，包括上位机与芯片功能测试板；上位机包括通过屏幕控制的处理器全功能批量自动测试上位机软件、调试器连接软件C-SkyDebugServer及下载调试软件CDK；芯片功能测试板包括单片机、待测处理器及FPGA。本发明可突破处理器内存限制，实现复杂的全功能批量自动测试，有效降低时间成本，大大提高测试效率，