Modeling method for multi-layer anti-missile cooperative combat mission planning

Modeling method for multi-layer anti-missile cooperative combat mission planning

The invention discloses a multi-layer anti-conductance cooperative combat mission planning modeling method, which comprises the following modeling steps: S1, establishing an anti-conductance killing area numerical model based on segmented interpolation: a1, performing segmented interpolation modelin...

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Bibliographische Detailangaben
Hauptverfasser: JI JUNLIANG, TIAN HAILIN, LI WEI, GAO HONGNI, CHENG LONG
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:The invention discloses a multi-layer anti-conductance cooperative combat mission planning modeling method, which comprises the following modeling steps: S1, establishing an anti-conductance killing area numerical model based on segmented interpolation: a1, performing segmented interpolation modeling on an anti-conductance vertical killing area, a2, establishing a vertical killing area model under different air route shortcuts, and a3, establishing a multi-layer anti-conductance cooperative combat mission planning model based on the multi-layer anti-conductance cooperative combat mission planning model; the method comprises the following steps: S1, constructing an anti-guided emission area and emission depth calculation model based on back-stepping calculation: b1, constructing a ballistic missile motion model, b2, constructing an anti-guided interception missile trajectory model, b3, carrying out back-stepping calculation on an anti-guided vertical emission area and an emission area depth, and S3, constructi