Optical emission spectrometer easy to adjust

The invention relates to an easy-to-tune optical emission spectrometer (1) and a method (100) for establishing and operating such a spectrometer (1), the spectrometer (1) comprising a plasma holder (2) for establishing a luminescent plasma from a sample material, and an optical system (3) for measur...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: PEETERS ANDRE, SIMONS, RAINER
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator PEETERS ANDRE
SIMONS, RAINER
description The invention relates to an easy-to-tune optical emission spectrometer (1) and a method (100) for establishing and operating such a spectrometer (1), the spectrometer (1) comprising a plasma holder (2) for establishing a luminescent plasma from a sample material, and an optical system (3) for measuring a spectrum of light (L) emitted by the plasma, the spectrum being a characteristic of the sample material, wherein the optical system (3) comprises at least one light entry aperture (31), at least one diffraction grating (32) for separating light (L) from the plasma (A) and one or more detectors (33) for measuring the spectrum of the light (L), wherein the plasma holder (2) and the optical system (3) are mounted directly and fixedly on a plasma holder flange (2B) and an optical system flange (3B), respectively, which are directly and fixedly connected to each other, and wherein the optical emission spectrometer (1) further comprises an analysis unit (34) adapted to analyze the measured spectrum, and compensatin
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN114585906A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN114585906A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN114585906A3</originalsourceid><addsrcrecordid>eNrjZNDxLyjJTE7MUUjNzSwuzszPUyguSE0uKcrPTS1JLVJITSyuVCjJV0hMySotLuFhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGJqYWppYGZo7GxKgBAL6iKjE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Optical emission spectrometer easy to adjust</title><source>esp@cenet</source><creator>PEETERS ANDRE ; SIMONS, RAINER</creator><creatorcontrib>PEETERS ANDRE ; SIMONS, RAINER</creatorcontrib><description>The invention relates to an easy-to-tune optical emission spectrometer (1) and a method (100) for establishing and operating such a spectrometer (1), the spectrometer (1) comprising a plasma holder (2) for establishing a luminescent plasma from a sample material, and an optical system (3) for measuring a spectrum of light (L) emitted by the plasma, the spectrum being a characteristic of the sample material, wherein the optical system (3) comprises at least one light entry aperture (31), at least one diffraction grating (32) for separating light (L) from the plasma (A) and one or more detectors (33) for measuring the spectrum of the light (L), wherein the plasma holder (2) and the optical system (3) are mounted directly and fixedly on a plasma holder flange (2B) and an optical system flange (3B), respectively, which are directly and fixedly connected to each other, and wherein the optical emission spectrometer (1) further comprises an analysis unit (34) adapted to analyze the measured spectrum, and compensatin</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220603&amp;DB=EPODOC&amp;CC=CN&amp;NR=114585906A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220603&amp;DB=EPODOC&amp;CC=CN&amp;NR=114585906A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PEETERS ANDRE</creatorcontrib><creatorcontrib>SIMONS, RAINER</creatorcontrib><title>Optical emission spectrometer easy to adjust</title><description>The invention relates to an easy-to-tune optical emission spectrometer (1) and a method (100) for establishing and operating such a spectrometer (1), the spectrometer (1) comprising a plasma holder (2) for establishing a luminescent plasma from a sample material, and an optical system (3) for measuring a spectrum of light (L) emitted by the plasma, the spectrum being a characteristic of the sample material, wherein the optical system (3) comprises at least one light entry aperture (31), at least one diffraction grating (32) for separating light (L) from the plasma (A) and one or more detectors (33) for measuring the spectrum of the light (L), wherein the plasma holder (2) and the optical system (3) are mounted directly and fixedly on a plasma holder flange (2B) and an optical system flange (3B), respectively, which are directly and fixedly connected to each other, and wherein the optical emission spectrometer (1) further comprises an analysis unit (34) adapted to analyze the measured spectrum, and compensatin</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDxLyjJTE7MUUjNzSwuzszPUyguSE0uKcrPTS1JLVJITSyuVCjJV0hMySotLuFhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGJqYWppYGZo7GxKgBAL6iKjE</recordid><startdate>20220603</startdate><enddate>20220603</enddate><creator>PEETERS ANDRE</creator><creator>SIMONS, RAINER</creator><scope>EVB</scope></search><sort><creationdate>20220603</creationdate><title>Optical emission spectrometer easy to adjust</title><author>PEETERS ANDRE ; SIMONS, RAINER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114585906A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PEETERS ANDRE</creatorcontrib><creatorcontrib>SIMONS, RAINER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PEETERS ANDRE</au><au>SIMONS, RAINER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Optical emission spectrometer easy to adjust</title><date>2022-06-03</date><risdate>2022</risdate><abstract>The invention relates to an easy-to-tune optical emission spectrometer (1) and a method (100) for establishing and operating such a spectrometer (1), the spectrometer (1) comprising a plasma holder (2) for establishing a luminescent plasma from a sample material, and an optical system (3) for measuring a spectrum of light (L) emitted by the plasma, the spectrum being a characteristic of the sample material, wherein the optical system (3) comprises at least one light entry aperture (31), at least one diffraction grating (32) for separating light (L) from the plasma (A) and one or more detectors (33) for measuring the spectrum of the light (L), wherein the plasma holder (2) and the optical system (3) are mounted directly and fixedly on a plasma holder flange (2B) and an optical system flange (3B), respectively, which are directly and fixedly connected to each other, and wherein the optical emission spectrometer (1) further comprises an analysis unit (34) adapted to analyze the measured spectrum, and compensatin</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN114585906A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Optical emission spectrometer easy to adjust
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-16T03%3A52%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=PEETERS%20ANDRE&rft.date=2022-06-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN114585906A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true