Method and display panel for verifying detection capability of automatic optical inspection
Provided are a display panel and a method for verifying detectability of automatic optical inspection, the display panel including: a substrate including a display area in which an element for display is provided and a peripheral area; and an inspection element group disposed in the peripheral regio...
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| creator | LEE YUL KYU LEE YOO-JIN |
| description | Provided are a display panel and a method for verifying detectability of automatic optical inspection, the display panel including: a substrate including a display area in which an element for display is provided and a peripheral area; and an inspection element group disposed in the peripheral region of the substrate, in which the inspection element group includes repeatedly disposed defects.
提供了一种显示面板和一种用于验证自动光学检查的检测能力的方法，所述显示面板包括：基底，包括显示区域和外围区域，在显示区域中设置有用于显示的元件；以及检查元件组，设置在基底的外围区域中，其中，检查元件组包括重复设置的缺陷。 |
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提供了一种显示面板和一种用于验证自动光学检查的检测能力的方法，所述显示面板包括：基底，包括显示区域和外围区域，在显示区域中设置有用于显示的元件；以及检查元件组，设置在基底的外围区域中，其中，检查元件组包括重复设置的缺陷。</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEKAjEQQNE0FqLeYTyA4Ko5gCyKjVZ2FsuYTHQgZobNKOztFfQANv83b-wuR7K7RMASIXLVjAMoFsqQpIcX9ZwGLjeIZBSMpUBAxStntgEkAT5NHmgcQPRTzMCl6pdO3ShhrjT7feLm-925PSxIpaOqGKiQde2paTbeN3652q7_MW-fPzvr</recordid><startdate>20220527</startdate><enddate>20220527</enddate><creator>LEE YUL KYU</creator><creator>LEE YOO-JIN</creator><scope>EVB</scope></search><sort><creationdate>20220527</creationdate><title>Method and display panel for verifying detection capability of automatic optical inspection</title><author>LEE YUL KYU ; LEE YOO-JIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114551502A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE YUL KYU</creatorcontrib><creatorcontrib>LEE YOO-JIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE YUL KYU</au><au>LEE YOO-JIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and display panel for verifying detection capability of automatic optical inspection</title><date>2022-05-27</date><risdate>2022</risdate><abstract>Provided are a display panel and a method for verifying detectability of automatic optical inspection, the display panel including: a substrate including a display area in which an element for display is provided and a peripheral area; and an inspection element group disposed in the peripheral region of the substrate, in which the inspection element group includes repeatedly disposed defects.
提供了一种显示面板和一种用于验证自动光学检查的检测能力的方法，所述显示面板包括：基底，包括显示区域和外围区域，在显示区域中设置有用于显示的元件；以及检查元件组，设置在基底的外围区域中，其中，检查元件组包括重复设置的缺陷。</abstract><oa>free_for_read</oa></addata></record> |
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| title | Method and display panel for verifying detection capability of automatic optical inspection |
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