Super junction device integrated with current sampling function
A super junction device integrated with a current sampling function sequentially comprises a super junction cellular region, a transition region and a terminal region from inside to outside, the transition region serves as a current sampling region at the same time, two second conduction type semico...
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| creator | YANG GUOJIANG YU SHIHENG |
| description | A super junction device integrated with a current sampling function sequentially comprises a super junction cellular region, a transition region and a terminal region from inside to outside, the transition region serves as a current sampling region at the same time, two second conduction type semiconductor columns are arranged in a first conduction type semiconductor epitaxial layer of the transition region, and second conduction type semiconductor regions are arranged on the tops of the first conduction type semiconductor columns. The tops of the two second conductive type semiconductor regions are respectively connected with a source potential and a grid potential, and a first conductive type semiconductor conductive channel is arranged between the two second conductive type semiconductor regions and is used for being connected with a current sampling end of an over-current protection circuit externally connected with the super junction device. The current sampling function is realized by using the transiti |
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The tops of the two second conductive type semiconductor regions are respectively connected with a source potential and a grid potential, and a first conductive type semiconductor conductive channel is arranged between the two second conductive type semiconductor regions and is used for being connected with a current sampling end of an over-current protection circuit externally connected with the super junction device. 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The tops of the two second conductive type semiconductor regions are respectively connected with a source potential and a grid potential, and a first conductive type semiconductor conductive channel is arranged between the two second conductive type semiconductor regions and is used for being connected with a current sampling end of an over-current protection circuit externally connected with the super junction device. 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The tops of the two second conductive type semiconductor regions are respectively connected with a source potential and a grid potential, and a first conductive type semiconductor conductive channel is arranged between the two second conductive type semiconductor regions and is used for being connected with a current sampling end of an over-current protection circuit externally connected with the super junction device. The current sampling function is realized by using the transiti</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
| title | Super junction device integrated with current sampling function |
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