Test paper structure analysis method based on span information and local attention

The invention discloses a test paper structure analysis method based on span information and local attention, and the method comprises the following steps: obtaining an electronic test paper, and preprocessing multivariate data in the electronic test paper into a unified branch structural text; the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MA ZHENYUAN, SHANG XICHEN, ZHENG YANKUI, MA QIANLI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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