Method and system for measuring electromagnetic radiation of electronic device

The invention discloses an electronic device electromagnetic radiation measurement method and system, and the method comprises the steps: carrying out the size scanning and near-field scanning of a test object, and determining the size boundary surface A and near-field magnetic field data of the test object; establishing a preliminary equivalent magnetic dipole model according to the size boundary surface A of the test object and the near-field magnetic field data, and performing real-time simulation to obtain simulation data; measuring far-field electric field data of the test object, comparing the far-field electric field data with the simulation data, and if a difference value between the far-field electric field data and the simulation data exceeds a preset numerical value, correcting the preliminary equivalent magnetic dipole model; when the number of the far-field measured point locations reaches a certain value and the difference between the far-field electric field data of the far-field measured point