Fault studying and judging method and device based on edge computing FTU and fault indicator
The invention relates to the technical field of distribution automation fault research and judgment, and discloses a fault research and judgment method based on an edge calculation FTU and a fault indicator, which comprises the following steps: acquiring recording data of a plurality of cycles befor...
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creator | QIN HAIBO GUO YUE TANG TONGFENG YANG HAO LI JUN ZHOU JINGJING WU LONG XU JIANBO JIANG DAYONG ZHAO ZHEYUAN LIU YANG SUN WEIDONG |
description | The invention relates to the technical field of distribution automation fault research and judgment, and discloses a fault research and judgment method based on an edge calculation FTU and a fault indicator, which comprises the following steps: acquiring recording data of a plurality of cycles before a fault recording starting moment and a plurality of cycles after the fault recording starting moment, and calculating fault waveform samples collected by the FTU based on the edge calculation; a first half-wave waveform research and judgment criterion is used as a main criterion of internal and external faults, a sample waveform correlation criterion is used for checking and rechecking internal and external recording samples of a first half-wave waveform research and judgment criterion conclusion, and the first half-wave waveform research and judgment criterion is used as an auxiliary criterion of first half-wave waveform research and judgment, comprehensive research and judgment are carried out, and a position |
format | Patent |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Fault studying and judging method and device based on edge computing FTU and fault indicator |
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