Holding capacitance health measurement with current leakage detection
Circuits for measuring leakage current of one or more capacitors coupled to a power line that powers an apparatus, such as a storage device, are disclosed. In one embodiment, the circuit includes first and second resistors located between respective first and second switches of a power supply line a...
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creator | LACKEY ROBERT SCOTT PLOSSORI ANDREW DAVID ROBINSON, BRIAN HARFORD |
description | Circuits for measuring leakage current of one or more capacitors coupled to a power line that powers an apparatus, such as a storage device, are disclosed. In one embodiment, the circuit includes first and second resistors located between respective first and second switches of a power supply line and ground. The controller may charge the voltage line to a first voltage. The controller then discharges the first voltage to the second voltage via the first resistor during the first identification time. After recharging the voltage line, the controller then discharges the first voltage to a second voltage via at least the second resistor during a second identification time. The controller determines a parasitic resistance using the first identification time and the second identification time, and then determines a leakage current from the parasitic resistance. Elimination of the leakage current factor from subsequent measurements can greatly improve test accuracy and can avoid false alarms during the test, other |
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In one embodiment, the circuit includes first and second resistors located between respective first and second switches of a power supply line and ground. The controller may charge the voltage line to a first voltage. The controller then discharges the first voltage to the second voltage via the first resistor during the first identification time. After recharging the voltage line, the controller then discharges the first voltage to a second voltage via at least the second resistor during a second identification time. The controller determines a parasitic resistance using the first identification time and the second identification time, and then determines a leakage current from the parasitic resistance. 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In one embodiment, the circuit includes first and second resistors located between respective first and second switches of a power supply line and ground. The controller may charge the voltage line to a first voltage. The controller then discharges the first voltage to the second voltage via the first resistor during the first identification time. After recharging the voltage line, the controller then discharges the first voltage to a second voltage via at least the second resistor during a second identification time. The controller determines a parasitic resistance using the first identification time and the second identification time, and then determines a leakage current from the parasitic resistance. 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In one embodiment, the circuit includes first and second resistors located between respective first and second switches of a power supply line and ground. The controller may charge the voltage line to a first voltage. The controller then discharges the first voltage to the second voltage via the first resistor during the first identification time. After recharging the voltage line, the controller then discharges the first voltage to a second voltage via at least the second resistor during a second identification time. The controller determines a parasitic resistance using the first identification time and the second identification time, and then determines a leakage current from the parasitic resistance. Elimination of the leakage current factor from subsequent measurements can greatly improve test accuracy and can avoid false alarms during the test, other</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES |
title | Holding capacitance health measurement with current leakage detection |
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