Device detection system and method thereof
The invention relates to the technical field of device detection, and discloses a device detection system and method. The device comprises a computer, a control box, a scanner, a CCD camera, a camera diaphragm and a detector, the computer is provided with operation software of a matched device detec...
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creator | SONG FUBAO ZHENG KAIYIN MUENCH YANG BIN CAI MAOLIN |
description | The invention relates to the technical field of device detection, and discloses a device detection system and method. The device comprises a computer, a control box, a scanner, a CCD camera, a camera diaphragm and a detector, the computer is provided with operation software of a matched device detection system, the device is a device with a zoom aperture, the operation software is provided with a port setting module, the port setting module is electrically connected with the control box through the computer, and the port setting module is used for driving the control box. The computer is electrically connected with the control box through a data signal line, the control box is electrically connected with the scanner through a data transceiving line, the control box is electrically connected with the CCD camera through a data acquisition line, the control box is electrically connected with the detector through a data wire, the detector is electrically connected with the device, and the surface appearance of th |
format | Patent |
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The device comprises a computer, a control box, a scanner, a CCD camera, a camera diaphragm and a detector, the computer is provided with operation software of a matched device detection system, the device is a device with a zoom aperture, the operation software is provided with a port setting module, the port setting module is electrically connected with the control box through the computer, and the port setting module is used for driving the control box. The computer is electrically connected with the control box through a data signal line, the control box is electrically connected with the scanner through a data transceiving line, the control box is electrically connected with the CCD camera through a data acquisition line, the control box is electrically connected with the detector through a data wire, the detector is electrically connected with the device, and the surface appearance of th</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING ELECTRIC VARIABLES ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220415&DB=EPODOC&CC=CN&NR=114355091A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220415&DB=EPODOC&CC=CN&NR=114355091A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SONG FUBAO</creatorcontrib><creatorcontrib>ZHENG KAIYIN</creatorcontrib><creatorcontrib>MUENCH</creatorcontrib><creatorcontrib>YANG BIN</creatorcontrib><creatorcontrib>CAI MAOLIN</creatorcontrib><title>Device detection system and method thereof</title><description>The invention relates to the technical field of device detection, and discloses a device detection system and method. 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language | chi ; eng |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Device detection system and method thereof |
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