Switch defect detection method based on LabVIEW deep learning

The invention provides a switch defect detection method based on LabVIEW deep learning. The method comprises the following steps: S1, image acquisition: acquiring a to-be-detected switch image; s2, image denoising: filtering the to-be-detected image to obtain a denoised image; s3, image enhancement:...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHEN ZENGBIAO, LIN LIANGZHONG, PU QINGMIN, YANG HONGGUI, ZHANG CHAO, YU HONGWEN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!