Diffraction identification imaging method and device, electronic equipment and medium
The invention discloses a diffraction recognition imaging method and device, electronic equipment and a medium. The method comprises the following steps: obtaining a common imaging point dip angle gather according to a seismic source signal and common shot point data; overlapping the common imaging...
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creator | XU WEIYA GAO HONG XIE FEI WEI ZHEFENG ZHU CHENGHONG |
description | The invention discloses a diffraction recognition imaging method and device, electronic equipment and a medium. The method comprises the following steps: obtaining a common imaging point dip angle gather according to a seismic source signal and common shot point data; overlapping the common imaging point dip angle gathers to obtain an offset imaging overlapped section, and recording coordinate positions of discontinuous scattering points and reflection points; determining diffraction energy vector labels and reflection energy vector labels, and establishing a label sample library; identifying an amplitude vector of each imaging point in the common imaging point dip angle gather, and determining a label of each imaging point through a KNN algorithm according to a label sample library; and superposing the inclination angle gathers of the imaging points of which the labels are diffraction labels to obtain a diffraction wave imaging result. According to the method, rapid and efficient imaging of diffraction energ |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN114114420A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN114114420A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN114114420A3</originalsourceid><addsrcrecordid>eNqNi0sKwkAQBWfjQtQ7tHsFo7mARMWVK12HpudN0pD5mEw8v0E9gPCgKKg3N4-TOtezZI2B1CJkdSr8Vc-NhoY8chstcbBk8VLBhtBBch-DCuE5avLT8RN4WB390swcdwNWPy7M-nK-V9ctUqwxJBYE5Lq6FUU5rdzvjod_mjcCqDlT</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Diffraction identification imaging method and device, electronic equipment and medium</title><source>esp@cenet</source><creator>XU WEIYA ; GAO HONG ; XIE FEI ; WEI ZHEFENG ; ZHU CHENGHONG</creator><creatorcontrib>XU WEIYA ; GAO HONG ; XIE FEI ; WEI ZHEFENG ; ZHU CHENGHONG</creatorcontrib><description>The invention discloses a diffraction recognition imaging method and device, electronic equipment and a medium. The method comprises the following steps: obtaining a common imaging point dip angle gather according to a seismic source signal and common shot point data; overlapping the common imaging point dip angle gathers to obtain an offset imaging overlapped section, and recording coordinate positions of discontinuous scattering points and reflection points; determining diffraction energy vector labels and reflection energy vector labels, and establishing a label sample library; identifying an amplitude vector of each imaging point in the common imaging point dip angle gather, and determining a label of each imaging point through a KNN algorithm according to a label sample library; and superposing the inclination angle gathers of the imaging points of which the labels are diffraction labels to obtain a diffraction wave imaging result. According to the method, rapid and efficient imaging of diffraction energ</description><language>chi ; eng</language><subject>DETECTING MASSES OR OBJECTS ; GEOPHYSICS ; GRAVITATIONAL MEASUREMENTS ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220301&DB=EPODOC&CC=CN&NR=114114420A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220301&DB=EPODOC&CC=CN&NR=114114420A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XU WEIYA</creatorcontrib><creatorcontrib>GAO HONG</creatorcontrib><creatorcontrib>XIE FEI</creatorcontrib><creatorcontrib>WEI ZHEFENG</creatorcontrib><creatorcontrib>ZHU CHENGHONG</creatorcontrib><title>Diffraction identification imaging method and device, electronic equipment and medium</title><description>The invention discloses a diffraction recognition imaging method and device, electronic equipment and a medium. The method comprises the following steps: obtaining a common imaging point dip angle gather according to a seismic source signal and common shot point data; overlapping the common imaging point dip angle gathers to obtain an offset imaging overlapped section, and recording coordinate positions of discontinuous scattering points and reflection points; determining diffraction energy vector labels and reflection energy vector labels, and establishing a label sample library; identifying an amplitude vector of each imaging point in the common imaging point dip angle gather, and determining a label of each imaging point through a KNN algorithm according to a label sample library; and superposing the inclination angle gathers of the imaging points of which the labels are diffraction labels to obtain a diffraction wave imaging result. According to the method, rapid and efficient imaging of diffraction energ</description><subject>DETECTING MASSES OR OBJECTS</subject><subject>GEOPHYSICS</subject><subject>GRAVITATIONAL MEASUREMENTS</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi0sKwkAQBWfjQtQ7tHsFo7mARMWVK12HpudN0pD5mEw8v0E9gPCgKKg3N4-TOtezZI2B1CJkdSr8Vc-NhoY8chstcbBk8VLBhtBBch-DCuE5avLT8RN4WB390swcdwNWPy7M-nK-V9ctUqwxJBYE5Lq6FUU5rdzvjod_mjcCqDlT</recordid><startdate>20220301</startdate><enddate>20220301</enddate><creator>XU WEIYA</creator><creator>GAO HONG</creator><creator>XIE FEI</creator><creator>WEI ZHEFENG</creator><creator>ZHU CHENGHONG</creator><scope>EVB</scope></search><sort><creationdate>20220301</creationdate><title>Diffraction identification imaging method and device, electronic equipment and medium</title><author>XU WEIYA ; GAO HONG ; XIE FEI ; WEI ZHEFENG ; ZHU CHENGHONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114114420A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>DETECTING MASSES OR OBJECTS</topic><topic>GEOPHYSICS</topic><topic>GRAVITATIONAL MEASUREMENTS</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XU WEIYA</creatorcontrib><creatorcontrib>GAO HONG</creatorcontrib><creatorcontrib>XIE FEI</creatorcontrib><creatorcontrib>WEI ZHEFENG</creatorcontrib><creatorcontrib>ZHU CHENGHONG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XU WEIYA</au><au>GAO HONG</au><au>XIE FEI</au><au>WEI ZHEFENG</au><au>ZHU CHENGHONG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Diffraction identification imaging method and device, electronic equipment and medium</title><date>2022-03-01</date><risdate>2022</risdate><abstract>The invention discloses a diffraction recognition imaging method and device, electronic equipment and a medium. The method comprises the following steps: obtaining a common imaging point dip angle gather according to a seismic source signal and common shot point data; overlapping the common imaging point dip angle gathers to obtain an offset imaging overlapped section, and recording coordinate positions of discontinuous scattering points and reflection points; determining diffraction energy vector labels and reflection energy vector labels, and establishing a label sample library; identifying an amplitude vector of each imaging point in the common imaging point dip angle gather, and determining a label of each imaging point through a KNN algorithm according to a label sample library; and superposing the inclination angle gathers of the imaging points of which the labels are diffraction labels to obtain a diffraction wave imaging result. According to the method, rapid and efficient imaging of diffraction energ</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS MEASURING PHYSICS TESTING |
title | Diffraction identification imaging method and device, electronic equipment and medium |
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