Deep learning-based microscopic character recognition and defect detection system and method
The invention discloses a deep learning-based microscopic character recognition and defect detection system and method. The system comprises a microscopic imaging visual device and a computer which is provided with a microscopic character recognition defect detection system connected with the micros...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a deep learning-based microscopic character recognition and defect detection system and method. The system comprises a microscopic imaging visual device and a computer which is provided with a microscopic character recognition defect detection system connected with the microscopic imaging visual device. The microscopic character recognition defect detection system comprises a focusing control module, a defect detection module and a character recognition module. The focusing control module is connected with a lifting stepping motor. The defect detection module is used for performing defect detection on a microchip on a sample set strip. The character recognition module is used for recognizing characters of the microchip on the sample set strip. The microscopic character recognition defect detection system outputs defect conditions and character recognition conditions according to defect detection and character recognition. According to the invention, microscopic imaging focusing operati |
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