Standardized pass logic test system

Standardized pass logic test system

The invention discloses a standardized passage logic test system, a gate is provided with a door plate, an infrared emitter, an infrared receiver and a controller, the controller controls the door plate to open and close and detects whether the door plate is opened and closed, and the test system co...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LEI YUANXIN, ZHAO MENGJUN, QIAN CHENQI, CAO LEI, MIAO HUADONG, MA YANGPING, ZHUANG YONGBO
Format: Patent
Sprache:chi ; eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator LEI YUANXIN
ZHAO MENGJUN
QIAN CHENQI
CAO LEI
MIAO HUADONG
MA YANGPING
ZHUANG YONGBO
description The invention discloses a standardized passage logic test system, a gate is provided with a door plate, an infrared emitter, an infrared receiver and a controller, the controller controls the door plate to open and close and detects whether the door plate is opened and closed, and the test system comprises a simulation light chopper and a passage simulator. The simulation light chopper is arranged between the infrared emitter and the infrared receiver and is switched between a full-light-shading state and a full-light-transmitting state so as to simulate the state when pedestrians pass by, and the passing simulator is connected with the simulation light chopper and the controller and sends a test control instruction to the simulation light chopper, receives a signal of whether opening and closing of the door plate of the controller are completed or not to the simulation light chopper, compares the test control instruction with the signal of whether opening and closing of the door plate are completed or not, a
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN114047737A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN114047737A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN114047737A3</originalsourceid><addsrcrecordid>eNrjZFAOLknMS0ksSsmsSk1RKEgsLlbIyU_PTFYoSS0uUSiuLC5JzeVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGJgYm5ubG5o7GxKgBAPJoJpU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Standardized pass logic test system</title><source>esp@cenet</source><creator>LEI YUANXIN ; ZHAO MENGJUN ; QIAN CHENQI ; CAO LEI ; MIAO HUADONG ; MA YANGPING ; ZHUANG YONGBO</creator><creatorcontrib>LEI YUANXIN ; ZHAO MENGJUN ; QIAN CHENQI ; CAO LEI ; MIAO HUADONG ; MA YANGPING ; ZHUANG YONGBO</creatorcontrib><description>The invention discloses a standardized passage logic test system, a gate is provided with a door plate, an infrared emitter, an infrared receiver and a controller, the controller controls the door plate to open and close and detects whether the door plate is opened and closed, and the test system comprises a simulation light chopper and a passage simulator. The simulation light chopper is arranged between the infrared emitter and the infrared receiver and is switched between a full-light-shading state and a full-light-transmitting state so as to simulate the state when pedestrians pass by, and the passing simulator is connected with the simulation light chopper and the controller and sends a test control instruction to the simulation light chopper, receives a signal of whether opening and closing of the door plate of the controller are completed or not to the simulation light chopper, compares the test control instruction with the signal of whether opening and closing of the door plate are completed or not, a</description><language>chi ; eng</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220215&amp;DB=EPODOC&amp;CC=CN&amp;NR=114047737A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220215&amp;DB=EPODOC&amp;CC=CN&amp;NR=114047737A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEI YUANXIN</creatorcontrib><creatorcontrib>ZHAO MENGJUN</creatorcontrib><creatorcontrib>QIAN CHENQI</creatorcontrib><creatorcontrib>CAO LEI</creatorcontrib><creatorcontrib>MIAO HUADONG</creatorcontrib><creatorcontrib>MA YANGPING</creatorcontrib><creatorcontrib>ZHUANG YONGBO</creatorcontrib><title>Standardized pass logic test system</title><description>The invention discloses a standardized passage logic test system, a gate is provided with a door plate, an infrared emitter, an infrared receiver and a controller, the controller controls the door plate to open and close and detects whether the door plate is opened and closed, and the test system comprises a simulation light chopper and a passage simulator. The simulation light chopper is arranged between the infrared emitter and the infrared receiver and is switched between a full-light-shading state and a full-light-transmitting state so as to simulate the state when pedestrians pass by, and the passing simulator is connected with the simulation light chopper and the controller and sends a test control instruction to the simulation light chopper, receives a signal of whether opening and closing of the door plate of the controller are completed or not to the simulation light chopper, compares the test control instruction with the signal of whether opening and closing of the door plate are completed or not, a</description><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAOLknMS0ksSsmsSk1RKEgsLlbIyU_PTFYoSS0uUSiuLC5JzeVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGJgYm5ubG5o7GxKgBAPJoJpU</recordid><startdate>20220215</startdate><enddate>20220215</enddate><creator>LEI YUANXIN</creator><creator>ZHAO MENGJUN</creator><creator>QIAN CHENQI</creator><creator>CAO LEI</creator><creator>MIAO HUADONG</creator><creator>MA YANGPING</creator><creator>ZHUANG YONGBO</creator><scope>EVB</scope></search><sort><creationdate>20220215</creationdate><title>Standardized pass logic test system</title><author>LEI YUANXIN ; ZHAO MENGJUN ; QIAN CHENQI ; CAO LEI ; MIAO HUADONG ; MA YANGPING ; ZHUANG YONGBO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114047737A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>LEI YUANXIN</creatorcontrib><creatorcontrib>ZHAO MENGJUN</creatorcontrib><creatorcontrib>QIAN CHENQI</creatorcontrib><creatorcontrib>CAO LEI</creatorcontrib><creatorcontrib>MIAO HUADONG</creatorcontrib><creatorcontrib>MA YANGPING</creatorcontrib><creatorcontrib>ZHUANG YONGBO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEI YUANXIN</au><au>ZHAO MENGJUN</au><au>QIAN CHENQI</au><au>CAO LEI</au><au>MIAO HUADONG</au><au>MA YANGPING</au><au>ZHUANG YONGBO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Standardized pass logic test system</title><date>2022-02-15</date><risdate>2022</risdate><abstract>The invention discloses a standardized passage logic test system, a gate is provided with a door plate, an infrared emitter, an infrared receiver and a controller, the controller controls the door plate to open and close and detects whether the door plate is opened and closed, and the test system comprises a simulation light chopper and a passage simulator. The simulation light chopper is arranged between the infrared emitter and the infrared receiver and is switched between a full-light-shading state and a full-light-transmitting state so as to simulate the state when pedestrians pass by, and the passing simulator is connected with the simulation light chopper and the controller and sends a test control instruction to the simulation light chopper, receives a signal of whether opening and closing of the door plate of the controller are completed or not to the simulation light chopper, compares the test control instruction with the signal of whether opening and closing of the door plate are completed or not, a</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN114047737A
source esp@cenet
subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
title Standardized pass logic test system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T07%3A25%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LEI%20YUANXIN&rft.date=2022-02-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN114047737A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true