Test circuit and test method for testing common source inductance of power device
The invention discloses a test circuit and a test method for testing the common-source inductance of a power device, which can accurately measure the common-source inductance of the power device, can build the test circuit at low cost, and measures the common-source inductance of the device accordin...
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| creator | WANG KANGPING YANG XU CHEN QIAOLIANG WU JIARUI WEI GAOHAO CHEN WENJIE WEI JIWEN |
| description | The invention discloses a test circuit and a test method for testing the common-source inductance of a power device, which can accurately measure the common-source inductance of the power device, can build the test circuit at low cost, and measures the common-source inductance of the device according to different packaging forms and sizes. Compared with a previous measurement mode, the test method provided by the invention not only can accurately measure the common-source inductance of the power device after the layout is determined, but also can measure the common-source inductance of the power device by considering the coupling effect between a power loop and a driving loop.
本发明公开了一种用于测试功率器件的共源电感的测试电路及测试方法，可以实现准确的测量功率器件的共源电感，同时可以低成本的搭建测试电路，针对不同的封装形式和大小测量器件的共源电感。相比于以前的测量方式，本发明的测量方法不仅能够实现对确定布局后的功率器件的共源电感准确测量，同时可以将功率回路和驱动回路之间的耦合效应考虑在内，对功率器件的共源电感进行测量。 |
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本发明公开了一种用于测试功率器件的共源电感的测试电路及测试方法，可以实现准确的测量功率器件的共源电感，同时可以低成本的搭建测试电路，针对不同的封装形式和大小测量器件的共源电感。相比于以前的测量方式，本发明的测量方法不仅能够实现对确定布局后的功率器件的共源电感准确测量，同时可以将功率回路和驱动回路之间的耦合效应考虑在内，对功率器件的共源电感进行测量。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220201&DB=EPODOC&CC=CN&NR=114002572A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220201&DB=EPODOC&CC=CN&NR=114002572A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG KANGPING</creatorcontrib><creatorcontrib>YANG XU</creatorcontrib><creatorcontrib>CHEN QIAOLIANG</creatorcontrib><creatorcontrib>WU JIARUI</creatorcontrib><creatorcontrib>WEI GAOHAO</creatorcontrib><creatorcontrib>CHEN WENJIE</creatorcontrib><creatorcontrib>WEI JIWEN</creatorcontrib><title>Test circuit and test method for testing common source inductance of power device</title><description>The invention discloses a test circuit and a test method for testing the common-source inductance of a power device, which can accurately measure the common-source inductance of the power device, can build the test circuit at low cost, and measures the common-source inductance of the device according to different packaging forms and sizes. Compared with a previous measurement mode, the test method provided by the invention not only can accurately measure the common-source inductance of the power device after the layout is determined, but also can measure the common-source inductance of the power device by considering the coupling effect between a power loop and a driving loop.
本发明公开了一种用于测试功率器件的共源电感的测试电路及测试方法，可以实现准确的测量功率器件的共源电感，同时可以低成本的搭建测试电路，针对不同的封装形式和大小测量器件的共源电感。相比于以前的测量方式，本发明的测量方法不仅能够实现对确定布局后的功率器件的共源电感准确测量，同时可以将功率回路和驱动回路之间的耦合效应考虑在内，对功率器件的共源电感进行测量。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNiksKAjEQBbNxIeod2gMIM6PiWgbFlSDMfgidjgZMd0g6en0_eABXr6p4U3MZqChgyFiDgmUH-gmR9CYOvOSvB74CSozCUKRmJAjsKqrlN4qHJE_K4OgRkOZm4u290OK3M7M8Hob-tKIkI5VkkZh07M9tu2mabrvr9ut_Pi_Slzea</recordid><startdate>20220201</startdate><enddate>20220201</enddate><creator>WANG KANGPING</creator><creator>YANG XU</creator><creator>CHEN QIAOLIANG</creator><creator>WU JIARUI</creator><creator>WEI GAOHAO</creator><creator>CHEN WENJIE</creator><creator>WEI JIWEN</creator><scope>EVB</scope></search><sort><creationdate>20220201</creationdate><title>Test circuit and test method for testing common source inductance of power device</title><author>WANG KANGPING ; YANG XU ; CHEN QIAOLIANG ; WU JIARUI ; WEI GAOHAO ; CHEN WENJIE ; WEI JIWEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114002572A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG KANGPING</creatorcontrib><creatorcontrib>YANG XU</creatorcontrib><creatorcontrib>CHEN QIAOLIANG</creatorcontrib><creatorcontrib>WU JIARUI</creatorcontrib><creatorcontrib>WEI GAOHAO</creatorcontrib><creatorcontrib>CHEN WENJIE</creatorcontrib><creatorcontrib>WEI JIWEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG KANGPING</au><au>YANG XU</au><au>CHEN QIAOLIANG</au><au>WU JIARUI</au><au>WEI GAOHAO</au><au>CHEN WENJIE</au><au>WEI JIWEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test circuit and test method for testing common source inductance of power device</title><date>2022-02-01</date><risdate>2022</risdate><abstract>The invention discloses a test circuit and a test method for testing the common-source inductance of a power device, which can accurately measure the common-source inductance of the power device, can build the test circuit at low cost, and measures the common-source inductance of the device according to different packaging forms and sizes. Compared with a previous measurement mode, the test method provided by the invention not only can accurately measure the common-source inductance of the power device after the layout is determined, but also can measure the common-source inductance of the power device by considering the coupling effect between a power loop and a driving loop.
本发明公开了一种用于测试功率器件的共源电感的测试电路及测试方法，可以实现准确的测量功率器件的共源电感，同时可以低成本的搭建测试电路，针对不同的封装形式和大小测量器件的共源电感。相比于以前的测量方式，本发明的测量方法不仅能够实现对确定布局后的功率器件的共源电感准确测量，同时可以将功率回路和驱动回路之间的耦合效应考虑在内，对功率器件的共源电感进行测量。</abstract><oa>free_for_read</oa></addata></record> |
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| title | Test circuit and test method for testing common source inductance of power device |
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