Preparation method of alignment mark and preparation method of fin field effect transistor

The embodiment of the invention provides a preparation method of an alignment mark and a preparation method of a fin field effect transistor, and relates to the technical field of semiconductors. The preparation method of the alignment mark comprises the following steps: forming a fin part on a subs...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHEN QINGHUANG, WANG JIANMING, ZENG WEISHUN, LIU ZHICHENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
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