Double-station drop hammer impact test device
A double-station drop hammer impact test device is characterized in that a movable frame is fixedly arranged on a guide bearing; a first electromagnet is arranged on the lower side of the movable frame; a transmission block is arranged below the first electromagnet; a first hammer is arranged below...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | A double-station drop hammer impact test device is characterized in that a movable frame is fixedly arranged on a guide bearing; a first electromagnet is arranged on the lower side of the movable frame; a transmission block is arranged below the first electromagnet; a first hammer is arranged below the transmission block; a vertical guide pipe is arranged on the lower side of a top beam; a sample clamp seat is arranged on a bottom plate; a mounting plate is arranged on the sample clamp seat; a second hammer is arranged on the mounting plate; a second electromagnet is arranged on the upper side of the second hammer; the second electromagnet is arranged below the guide pipe; and a second motor is arranged on the top beam. The device is simple and convenient to operate. Two test devices for testing products with different attributes are combined into a whole, and the products with the different attributes are tested through a first station and a second station respectively. The device is compact in structure, an |
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