Height measurement method and device based on target and equipment
The invention relates to the field of crop height measurement, in particular to a target-based height measurement method and device, and equipment, and the method comprises the following steps: obtaining a three-dimensional point cloud containing a point cloud of an object to be measured, a target p...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the field of crop height measurement, in particular to a target-based height measurement method and device, and equipment, and the method comprises the following steps: obtaining a three-dimensional point cloud containing a point cloud of an object to be measured, a target point cloud existing in the three-dimensional point cloud; calculating a target normal vector of a plane where the target point cloud is located, and obtaining a three-dimensional rotation matrix through calculation based on the target normal vector, the ground normal vector and the included angle between the target normal vector and the ground normal vector; and adjusting the three-dimensional point cloud according to the three-dimensional rotation matrix, and measuring the height of the object to be measured by using the adjusted three-dimensional point cloud. The three-dimensional point cloud after fine adjustment is used for height measurement, and measurement deviation caused by errors existing in manual measur |
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