Detection method capable of being used for surface microdefect imaging of stamping parts
The invention discloses a detection method capable of being used for surface micro-defect imaging of stamping parts. The detection method comprises the following steps: S1, collecting generalized phase shift dual-wavelength interferograms of a plurality of micro-defect stamping parts and correspondi...
Gespeichert in:
| Hauptverfasser: | , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | XU XIAOQING HUANG WENBO BO KANGYING WANG TING MENG YUHAN |
| description | The invention discloses a detection method capable of being used for surface micro-defect imaging of stamping parts. The detection method comprises the following steps: S1, collecting generalized phase shift dual-wavelength interferograms of a plurality of micro-defect stamping parts and corresponding single-wavelength interferograms of the micro-defect stamping parts; S2, after the collected generalized phase-shift dual-wavelength interferograms of the micro-defect stamping part and the corresponding single-wavelength interferograms of the micro-defect stamping part are cut, an interferogram data set of the micro-defect stamping part is constructed; S3, designing a micro-defect stamping part dual-wavelength interference diagram decoupling convolutional neural network based on deep learning; and S4, using the microdefect stamping part to interfere the pattern data set. The invention provides a detection method capable of being used for stamping part surface microdefect imaging, so that the method can quickly |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN113706509A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN113706509A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN113706509A3</originalsourceid><addsrcrecordid>eNqNzDEOwjAQBEA3FAj4w_EApEQRoJQogKioKOiii30OlmKfZV_-jyPxAKrdYnbX6n0lIS2OA3iSDxvQGHGYCNjCQC6MMGcyYDlBnpNFTeCdTmzIlh04j-OCis6CPi49YpK8VSuLU6bdLzdqf7-9useBIveUYzkKJH33rOvmXJ2OVXtp_jFfhAE6JQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Detection method capable of being used for surface microdefect imaging of stamping parts</title><source>esp@cenet</source><creator>XU XIAOQING ; HUANG WENBO ; BO KANGYING ; WANG TING ; MENG YUHAN</creator><creatorcontrib>XU XIAOQING ; HUANG WENBO ; BO KANGYING ; WANG TING ; MENG YUHAN</creatorcontrib><description>The invention discloses a detection method capable of being used for surface micro-defect imaging of stamping parts. The detection method comprises the following steps: S1, collecting generalized phase shift dual-wavelength interferograms of a plurality of micro-defect stamping parts and corresponding single-wavelength interferograms of the micro-defect stamping parts; S2, after the collected generalized phase-shift dual-wavelength interferograms of the micro-defect stamping part and the corresponding single-wavelength interferograms of the micro-defect stamping part are cut, an interferogram data set of the micro-defect stamping part is constructed; S3, designing a micro-defect stamping part dual-wavelength interference diagram decoupling convolutional neural network based on deep learning; and S4, using the microdefect stamping part to interfere the pattern data set. The invention provides a detection method capable of being used for stamping part surface microdefect imaging, so that the method can quickly</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211126&DB=EPODOC&CC=CN&NR=113706509A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211126&DB=EPODOC&CC=CN&NR=113706509A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XU XIAOQING</creatorcontrib><creatorcontrib>HUANG WENBO</creatorcontrib><creatorcontrib>BO KANGYING</creatorcontrib><creatorcontrib>WANG TING</creatorcontrib><creatorcontrib>MENG YUHAN</creatorcontrib><title>Detection method capable of being used for surface microdefect imaging of stamping parts</title><description>The invention discloses a detection method capable of being used for surface micro-defect imaging of stamping parts. The detection method comprises the following steps: S1, collecting generalized phase shift dual-wavelength interferograms of a plurality of micro-defect stamping parts and corresponding single-wavelength interferograms of the micro-defect stamping parts; S2, after the collected generalized phase-shift dual-wavelength interferograms of the micro-defect stamping part and the corresponding single-wavelength interferograms of the micro-defect stamping part are cut, an interferogram data set of the micro-defect stamping part is constructed; S3, designing a micro-defect stamping part dual-wavelength interference diagram decoupling convolutional neural network based on deep learning; and S4, using the microdefect stamping part to interfere the pattern data set. The invention provides a detection method capable of being used for stamping part surface microdefect imaging, so that the method can quickly</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzDEOwjAQBEA3FAj4w_EApEQRoJQogKioKOiii30OlmKfZV_-jyPxAKrdYnbX6n0lIS2OA3iSDxvQGHGYCNjCQC6MMGcyYDlBnpNFTeCdTmzIlh04j-OCis6CPi49YpK8VSuLU6bdLzdqf7-9useBIveUYzkKJH33rOvmXJ2OVXtp_jFfhAE6JQ</recordid><startdate>20211126</startdate><enddate>20211126</enddate><creator>XU XIAOQING</creator><creator>HUANG WENBO</creator><creator>BO KANGYING</creator><creator>WANG TING</creator><creator>MENG YUHAN</creator><scope>EVB</scope></search><sort><creationdate>20211126</creationdate><title>Detection method capable of being used for surface microdefect imaging of stamping parts</title><author>XU XIAOQING ; HUANG WENBO ; BO KANGYING ; WANG TING ; MENG YUHAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113706509A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><toplevel>online_resources</toplevel><creatorcontrib>XU XIAOQING</creatorcontrib><creatorcontrib>HUANG WENBO</creatorcontrib><creatorcontrib>BO KANGYING</creatorcontrib><creatorcontrib>WANG TING</creatorcontrib><creatorcontrib>MENG YUHAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XU XIAOQING</au><au>HUANG WENBO</au><au>BO KANGYING</au><au>WANG TING</au><au>MENG YUHAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Detection method capable of being used for surface microdefect imaging of stamping parts</title><date>2021-11-26</date><risdate>2021</risdate><abstract>The invention discloses a detection method capable of being used for surface micro-defect imaging of stamping parts. The detection method comprises the following steps: S1, collecting generalized phase shift dual-wavelength interferograms of a plurality of micro-defect stamping parts and corresponding single-wavelength interferograms of the micro-defect stamping parts; S2, after the collected generalized phase-shift dual-wavelength interferograms of the micro-defect stamping part and the corresponding single-wavelength interferograms of the micro-defect stamping part are cut, an interferogram data set of the micro-defect stamping part is constructed; S3, designing a micro-defect stamping part dual-wavelength interference diagram decoupling convolutional neural network based on deep learning; and S4, using the microdefect stamping part to interfere the pattern data set. The invention provides a detection method capable of being used for stamping part surface microdefect imaging, so that the method can quickly</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN113706509A |
| source | esp@cenet |
| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS |
| title | Detection method capable of being used for surface microdefect imaging of stamping parts |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T05%3A57%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=XU%20XIAOQING&rft.date=2021-11-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN113706509A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |