Method for calculating test question distinction degree before examination

The invention discloses a method for calculating test question distinction degree before an examination, and belongs to the technical field of education evaluation. According to the method, intelligent indexes in a whole set of test questions are counted, then the intelligent indexes are used as an...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: CHANG WEIYUAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CHANG WEIYUAN
description The invention discloses a method for calculating test question distinction degree before an examination, and belongs to the technical field of education evaluation. According to the method, intelligent indexes in a whole set of test questions are counted, then the intelligent indexes are used as an analysis basis to calculate an equivalent number of multiple iterations, and finally the equivalent number is substituted into a distinction degree calculation formula to obtain the distinction degree of the whole set of test questions. According to the method, after the whole set of test questions are combined, the distinction degree of the test questions can be calculated, and then whether the whole set of test questions meet the requirement of the selective test is evaluated. The distinction degree is calculated before the test questions are used for testing, so that the evaluation effect of the distinction degree on the test questions can be really exerted, and the operability of selectable test can be ensured.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN113706004A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN113706004A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN113706004A3</originalsourceid><addsrcrecordid>eNrjZPDyTS3JyE9RSMsvUkhOzEkuzUksycxLVyhJLS5RKCwFkpn5eQopmUA6LxnCTk0vSk1VSEoFaklVSK1IzM3MSwTJ8DCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_Q0NjcwMzAwMTR2Ni1AAAa0o1qA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for calculating test question distinction degree before examination</title><source>esp@cenet</source><creator>CHANG WEIYUAN</creator><creatorcontrib>CHANG WEIYUAN</creatorcontrib><description>The invention discloses a method for calculating test question distinction degree before an examination, and belongs to the technical field of education evaluation. According to the method, intelligent indexes in a whole set of test questions are counted, then the intelligent indexes are used as an analysis basis to calculate an equivalent number of multiple iterations, and finally the equivalent number is substituted into a distinction degree calculation formula to obtain the distinction degree of the whole set of test questions. According to the method, after the whole set of test questions are combined, the distinction degree of the test questions can be calculated, and then whether the whole set of test questions meet the requirement of the selective test is evaluated. The distinction degree is calculated before the test questions are used for testing, so that the evaluation effect of the distinction degree on the test questions can be really exerted, and the operability of selectable test can be ensured.</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20211126&amp;DB=EPODOC&amp;CC=CN&amp;NR=113706004A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20211126&amp;DB=EPODOC&amp;CC=CN&amp;NR=113706004A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHANG WEIYUAN</creatorcontrib><title>Method for calculating test question distinction degree before examination</title><description>The invention discloses a method for calculating test question distinction degree before an examination, and belongs to the technical field of education evaluation. According to the method, intelligent indexes in a whole set of test questions are counted, then the intelligent indexes are used as an analysis basis to calculate an equivalent number of multiple iterations, and finally the equivalent number is substituted into a distinction degree calculation formula to obtain the distinction degree of the whole set of test questions. According to the method, after the whole set of test questions are combined, the distinction degree of the test questions can be calculated, and then whether the whole set of test questions meet the requirement of the selective test is evaluated. The distinction degree is calculated before the test questions are used for testing, so that the evaluation effect of the distinction degree on the test questions can be really exerted, and the operability of selectable test can be ensured.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDyTS3JyE9RSMsvUkhOzEkuzUksycxLVyhJLS5RKCwFkpn5eQopmUA6LxnCTk0vSk1VSEoFaklVSK1IzM3MSwTJ8DCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_Q0NjcwMzAwMTR2Ni1AAAa0o1qA</recordid><startdate>20211126</startdate><enddate>20211126</enddate><creator>CHANG WEIYUAN</creator><scope>EVB</scope></search><sort><creationdate>20211126</creationdate><title>Method for calculating test question distinction degree before examination</title><author>CHANG WEIYUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113706004A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>CHANG WEIYUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHANG WEIYUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for calculating test question distinction degree before examination</title><date>2021-11-26</date><risdate>2021</risdate><abstract>The invention discloses a method for calculating test question distinction degree before an examination, and belongs to the technical field of education evaluation. According to the method, intelligent indexes in a whole set of test questions are counted, then the intelligent indexes are used as an analysis basis to calculate an equivalent number of multiple iterations, and finally the equivalent number is substituted into a distinction degree calculation formula to obtain the distinction degree of the whole set of test questions. According to the method, after the whole set of test questions are combined, the distinction degree of the test questions can be calculated, and then whether the whole set of test questions meet the requirement of the selective test is evaluated. The distinction degree is calculated before the test questions are used for testing, so that the evaluation effect of the distinction degree on the test questions can be really exerted, and the operability of selectable test can be ensured.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN113706004A
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
title Method for calculating test question distinction degree before examination
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T08%3A47%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHANG%20WEIYUAN&rft.date=2021-11-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN113706004A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true