A basic seedling accurate calculation method in wheat super-high-yield cultivation
The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to Januar...
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creator | XU DEHUA XIA GUIPING |
description | The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to January of the next year as initial calculation data; substituting the average temperature value of the ten days of each month into a day-by-day simulation average temperature value calculation formula to obtain the temperature value of each day in the first ten days; substituting the obtained data into a formula for calculating the day-by-day effective accumulated temperature value of the wheat before winter, and calculating the day-by-day effective accumulated temperature value of the wheat before winter; obtaining basic seedlings of the wheat on the basis of various biological characteristics of the wheat in combination with an empirical derivation formula; further calculating the basic wheat seedlings accurately, the |
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The method comprises the following steps: taking an average temperature value of a weather station from October to January of the next year as initial calculation data; substituting the average temperature value of the ten days of each month into a day-by-day simulation average temperature value calculation formula to obtain the temperature value of each day in the first ten days; substituting the obtained data into a formula for calculating the day-by-day effective accumulated temperature value of the wheat before winter, and calculating the day-by-day effective accumulated temperature value of the wheat before winter; obtaining basic seedlings of the wheat on the basis of various biological characteristics of the wheat in combination with an empirical derivation formula; further calculating the basic wheat seedlings accurately, the</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211112&DB=EPODOC&CC=CN&NR=113641941A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211112&DB=EPODOC&CC=CN&NR=113641941A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XU DEHUA</creatorcontrib><creatorcontrib>XIA GUIPING</creatorcontrib><title>A basic seedling accurate calculation method in wheat super-high-yield cultivation</title><description>The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to January of the next year as initial calculation data; substituting the average temperature value of the ten days of each month into a day-by-day simulation average temperature value calculation formula to obtain the temperature value of each day in the first ten days; substituting the obtained data into a formula for calculating the day-by-day effective accumulated temperature value of the wheat before winter, and calculating the day-by-day effective accumulated temperature value of the wheat before winter; obtaining basic seedlings of the wheat on the basis of various biological characteristics of the wheat in combination with an empirical derivation formula; further calculating the basic wheat seedlings accurately, the</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAsDqL-w_kBGUKL4FiK4uQg7uW8nM1BmoQmUfx7RfwAp7e8pbp0cMMsBJnZegkjIFGdsTAQeqoei8QAExcXLUiAp2MskGviWTsZnX4JewufWeTxzWu1uKPPvPm5Utvj4dqfNKc4cE5IHLgM_dmYZteafWu65p_zBgmhOB0</recordid><startdate>20211112</startdate><enddate>20211112</enddate><creator>XU DEHUA</creator><creator>XIA GUIPING</creator><scope>EVB</scope></search><sort><creationdate>20211112</creationdate><title>A basic seedling accurate calculation method in wheat super-high-yield cultivation</title><author>XU DEHUA ; XIA GUIPING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113641941A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>XU DEHUA</creatorcontrib><creatorcontrib>XIA GUIPING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XU DEHUA</au><au>XIA GUIPING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>A basic seedling accurate calculation method in wheat super-high-yield cultivation</title><date>2021-11-12</date><risdate>2021</risdate><abstract>The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to January of the next year as initial calculation data; substituting the average temperature value of the ten days of each month into a day-by-day simulation average temperature value calculation formula to obtain the temperature value of each day in the first ten days; substituting the obtained data into a formula for calculating the day-by-day effective accumulated temperature value of the wheat before winter, and calculating the day-by-day effective accumulated temperature value of the wheat before winter; obtaining basic seedlings of the wheat on the basis of various biological characteristics of the wheat in combination with an empirical derivation formula; further calculating the basic wheat seedlings accurately, the</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
title | A basic seedling accurate calculation method in wheat super-high-yield cultivation |
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