A basic seedling accurate calculation method in wheat super-high-yield cultivation

The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to Januar...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: XU DEHUA, XIA GUIPING
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator XU DEHUA
XIA GUIPING
description The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to January of the next year as initial calculation data; substituting the average temperature value of the ten days of each month into a day-by-day simulation average temperature value calculation formula to obtain the temperature value of each day in the first ten days; substituting the obtained data into a formula for calculating the day-by-day effective accumulated temperature value of the wheat before winter, and calculating the day-by-day effective accumulated temperature value of the wheat before winter; obtaining basic seedlings of the wheat on the basis of various biological characteristics of the wheat in combination with an empirical derivation formula; further calculating the basic wheat seedlings accurately, the
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN113641941A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN113641941A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN113641941A3</originalsourceid><addsrcrecordid>eNqNyrEKwjAQANAsDqL-w_kBGUKL4FiK4uQg7uW8nM1BmoQmUfx7RfwAp7e8pbp0cMMsBJnZegkjIFGdsTAQeqoei8QAExcXLUiAp2MskGviWTsZnX4JewufWeTxzWu1uKPPvPm5Utvj4dqfNKc4cE5IHLgM_dmYZteafWu65p_zBgmhOB0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>A basic seedling accurate calculation method in wheat super-high-yield cultivation</title><source>esp@cenet</source><creator>XU DEHUA ; XIA GUIPING</creator><creatorcontrib>XU DEHUA ; XIA GUIPING</creatorcontrib><description>The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to January of the next year as initial calculation data; substituting the average temperature value of the ten days of each month into a day-by-day simulation average temperature value calculation formula to obtain the temperature value of each day in the first ten days; substituting the obtained data into a formula for calculating the day-by-day effective accumulated temperature value of the wheat before winter, and calculating the day-by-day effective accumulated temperature value of the wheat before winter; obtaining basic seedlings of the wheat on the basis of various biological characteristics of the wheat in combination with an empirical derivation formula; further calculating the basic wheat seedlings accurately, the</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20211112&amp;DB=EPODOC&amp;CC=CN&amp;NR=113641941A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20211112&amp;DB=EPODOC&amp;CC=CN&amp;NR=113641941A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XU DEHUA</creatorcontrib><creatorcontrib>XIA GUIPING</creatorcontrib><title>A basic seedling accurate calculation method in wheat super-high-yield cultivation</title><description>The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to January of the next year as initial calculation data; substituting the average temperature value of the ten days of each month into a day-by-day simulation average temperature value calculation formula to obtain the temperature value of each day in the first ten days; substituting the obtained data into a formula for calculating the day-by-day effective accumulated temperature value of the wheat before winter, and calculating the day-by-day effective accumulated temperature value of the wheat before winter; obtaining basic seedlings of the wheat on the basis of various biological characteristics of the wheat in combination with an empirical derivation formula; further calculating the basic wheat seedlings accurately, the</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAsDqL-w_kBGUKL4FiK4uQg7uW8nM1BmoQmUfx7RfwAp7e8pbp0cMMsBJnZegkjIFGdsTAQeqoei8QAExcXLUiAp2MskGviWTsZnX4JewufWeTxzWu1uKPPvPm5Utvj4dqfNKc4cE5IHLgM_dmYZteafWu65p_zBgmhOB0</recordid><startdate>20211112</startdate><enddate>20211112</enddate><creator>XU DEHUA</creator><creator>XIA GUIPING</creator><scope>EVB</scope></search><sort><creationdate>20211112</creationdate><title>A basic seedling accurate calculation method in wheat super-high-yield cultivation</title><author>XU DEHUA ; XIA GUIPING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113641941A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>XU DEHUA</creatorcontrib><creatorcontrib>XIA GUIPING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XU DEHUA</au><au>XIA GUIPING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>A basic seedling accurate calculation method in wheat super-high-yield cultivation</title><date>2021-11-12</date><risdate>2021</risdate><abstract>The invention belongs to the technical field of wheat cultivation, and particularly relates to a basic seedling accurate calculation method in wheat super-high-yield cultivation. The method comprises the following steps: taking an average temperature value of a weather station from October to January of the next year as initial calculation data; substituting the average temperature value of the ten days of each month into a day-by-day simulation average temperature value calculation formula to obtain the temperature value of each day in the first ten days; substituting the obtained data into a formula for calculating the day-by-day effective accumulated temperature value of the wheat before winter, and calculating the day-by-day effective accumulated temperature value of the wheat before winter; obtaining basic seedlings of the wheat on the basis of various biological characteristics of the wheat in combination with an empirical derivation formula; further calculating the basic wheat seedlings accurately, the</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN113641941A
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title A basic seedling accurate calculation method in wheat super-high-yield cultivation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T06%3A21%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=XU%20DEHUA&rft.date=2021-11-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN113641941A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true