Low-irradiance test system for back surface of assembly

The invention discloses a low-irradiance test system for the back surface of an assembly. The low-irradiance test system comprises a standard solar cell, a circuit board and a high-precision current tester, wherein the standard solar cell is arranged on the backlight surface of the test assembly, th...

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Hauptverfasser: WEI RONGZHANG, JU XIANG, CHANG ZHAN
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creator WEI RONGZHANG
JU XIANG
CHANG ZHAN
description The invention discloses a low-irradiance test system for the back surface of an assembly. The low-irradiance test system comprises a standard solar cell, a circuit board and a high-precision current tester, wherein the standard solar cell is arranged on the backlight surface of the test assembly, the light facing surface of the test assembly is provided with a test lamp, the current output end of the standard solar cell is connected to the input end of the circuit board, and the output end of the circuit board is connected to the high-precision current tester. According to the invention, the IEC requirement can be realized, the weak light intensity can be accurately measured on the back surface of the assembly, and a user can improve the test environment according to the back surface light intensity measured by himself/herself; and a weak voltage signal in a short time is grabbed through the high-precision current tester and is converted into a readable number through a circuit board signal amplification mode
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language chi ; eng
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subjects COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
title Low-irradiance test system for back surface of assembly
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