Low-irradiance test system for back surface of assembly
The invention discloses a low-irradiance test system for the back surface of an assembly. The low-irradiance test system comprises a standard solar cell, a circuit board and a high-precision current tester, wherein the standard solar cell is arranged on the backlight surface of the test assembly, th...
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creator | WEI RONGZHANG JU XIANG CHANG ZHAN |
description | The invention discloses a low-irradiance test system for the back surface of an assembly. The low-irradiance test system comprises a standard solar cell, a circuit board and a high-precision current tester, wherein the standard solar cell is arranged on the backlight surface of the test assembly, the light facing surface of the test assembly is provided with a test lamp, the current output end of the standard solar cell is connected to the input end of the circuit board, and the output end of the circuit board is connected to the high-precision current tester. According to the invention, the IEC requirement can be realized, the weak light intensity can be accurately measured on the back surface of the assembly, and a user can improve the test environment according to the back surface light intensity measured by himself/herself; and a weak voltage signal in a short time is grabbed through the high-precision current tester and is converted into a readable number through a circuit board signal amplification mode |
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The low-irradiance test system comprises a standard solar cell, a circuit board and a high-precision current tester, wherein the standard solar cell is arranged on the backlight surface of the test assembly, the light facing surface of the test assembly is provided with a test lamp, the current output end of the standard solar cell is connected to the input end of the circuit board, and the output end of the circuit board is connected to the high-precision current tester. According to the invention, the IEC requirement can be realized, the weak light intensity can be accurately measured on the back surface of the assembly, and a user can improve the test environment according to the back surface light intensity measured by himself/herself; and a weak voltage signal in a short time is grabbed through the high-precision current tester and is converted into a readable number through a circuit board signal amplification mode</description><language>chi ; eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211105&DB=EPODOC&CC=CN&NR=113607276A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211105&DB=EPODOC&CC=CN&NR=113607276A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WEI RONGZHANG</creatorcontrib><creatorcontrib>JU XIANG</creatorcontrib><creatorcontrib>CHANG ZHAN</creatorcontrib><title>Low-irradiance test system for back surface of assembly</title><description>The invention discloses a low-irradiance test system for the back surface of an assembly. 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According to the invention, the IEC requirement can be realized, the weak light intensity can be accurately measured on the back surface of the assembly, and a user can improve the test environment according to the back surface light intensity measured by himself/herself; and a weak voltage signal in a short time is grabbed through the high-precision current tester and is converted into a readable number through a circuit board signal amplification mode</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD3yS_XzSwqSkzJTMxLTlUoSS0uUSiuLC5JzVVIyy9SSEpMzlYoLi1KSwRK5qcpJBYXp-Ym5VTyMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4gKg8rzUknhnP0NDYzMDcyNzM0djYtQAAMXJLcw</recordid><startdate>20211105</startdate><enddate>20211105</enddate><creator>WEI RONGZHANG</creator><creator>JU XIANG</creator><creator>CHANG ZHAN</creator><scope>EVB</scope></search><sort><creationdate>20211105</creationdate><title>Low-irradiance test system for back surface of assembly</title><author>WEI RONGZHANG ; JU XIANG ; CHANG ZHAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113607276A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WEI RONGZHANG</creatorcontrib><creatorcontrib>JU XIANG</creatorcontrib><creatorcontrib>CHANG ZHAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WEI RONGZHANG</au><au>JU XIANG</au><au>CHANG ZHAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Low-irradiance test system for back surface of assembly</title><date>2021-11-05</date><risdate>2021</risdate><abstract>The invention discloses a low-irradiance test system for the back surface of an assembly. The low-irradiance test system comprises a standard solar cell, a circuit board and a high-precision current tester, wherein the standard solar cell is arranged on the backlight surface of the test assembly, the light facing surface of the test assembly is provided with a test lamp, the current output end of the standard solar cell is connected to the input end of the circuit board, and the output end of the circuit board is connected to the high-precision current tester. According to the invention, the IEC requirement can be realized, the weak light intensity can be accurately measured on the back surface of the assembly, and a user can improve the test environment according to the back surface light intensity measured by himself/herself; and a weak voltage signal in a short time is grabbed through the high-precision current tester and is converted into a readable number through a circuit board signal amplification mode</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
title | Low-irradiance test system for back surface of assembly |
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