Library matching method and system for optical scattering, server and storage medium
The invention relates to a library matching method and system for optical scattering, a server and a readable storage medium, and the method comprises the steps: building a theoretical spectrum library for a to-be-measured target, setting a nominal value of a morphology parameter, carrying out the i...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | GUO CHUNFU TAO ZE SHI YUTUO ZHANG HOUDAO MA JUN LI WEIQI |
description | The invention relates to a library matching method and system for optical scattering, a server and a readable storage medium, and the method comprises the steps: building a theoretical spectrum library for a to-be-measured target, setting a nominal value of a morphology parameter, carrying out the interpolation of the theoretical spectrum library of the morphology parameter, obtaining an interpolation theoretical spectrum corresponding to the nominal value of the morphology parameter, and carrying out the calculation of the interpolation theoretical spectrum. obtaining a measurement spectrum through measurement, calculating a deviation value between the measurement spectrum and a theoretical spectrum, and when the deviation value does not meet a threshold value condition, updating the nominal value of the morphology parameter until the deviation value meets the threshold value condition, so that the extraction speed is increased under the condition that the extraction accuracy is not influenced, and the techn |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN113566739A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN113566739A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN113566739A3</originalsourceid><addsrcrecordid>eNqNyz0KwkAQQOE0FqLeYey1CIsRSwmKhVilD-PuJFnI_jAzCrm9AT2A1Wu-tyyau38y8gQB1Q4-9hBIh-QAowOZRClAlxhSVm9xBLGoSjzDHQjxm_grNTH2NM_Ov8K6WHQ4Cm1-XRXb66Wpb3vKqSXJaCmStvWjLM2hqo7mdDb_mA-pYTj5</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Library matching method and system for optical scattering, server and storage medium</title><source>esp@cenet</source><creator>GUO CHUNFU ; TAO ZE ; SHI YUTUO ; ZHANG HOUDAO ; MA JUN ; LI WEIQI</creator><creatorcontrib>GUO CHUNFU ; TAO ZE ; SHI YUTUO ; ZHANG HOUDAO ; MA JUN ; LI WEIQI</creatorcontrib><description>The invention relates to a library matching method and system for optical scattering, a server and a readable storage medium, and the method comprises the steps: building a theoretical spectrum library for a to-be-measured target, setting a nominal value of a morphology parameter, carrying out the interpolation of the theoretical spectrum library of the morphology parameter, obtaining an interpolation theoretical spectrum corresponding to the nominal value of the morphology parameter, and carrying out the calculation of the interpolation theoretical spectrum. obtaining a measurement spectrum through measurement, calculating a deviation value between the measurement spectrum and a theoretical spectrum, and when the deviation value does not meet a threshold value condition, updating the nominal value of the morphology parameter until the deviation value meets the threshold value condition, so that the extraction speed is increased under the condition that the extraction accuracy is not influenced, and the techn</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211029&DB=EPODOC&CC=CN&NR=113566739A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211029&DB=EPODOC&CC=CN&NR=113566739A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GUO CHUNFU</creatorcontrib><creatorcontrib>TAO ZE</creatorcontrib><creatorcontrib>SHI YUTUO</creatorcontrib><creatorcontrib>ZHANG HOUDAO</creatorcontrib><creatorcontrib>MA JUN</creatorcontrib><creatorcontrib>LI WEIQI</creatorcontrib><title>Library matching method and system for optical scattering, server and storage medium</title><description>The invention relates to a library matching method and system for optical scattering, a server and a readable storage medium, and the method comprises the steps: building a theoretical spectrum library for a to-be-measured target, setting a nominal value of a morphology parameter, carrying out the interpolation of the theoretical spectrum library of the morphology parameter, obtaining an interpolation theoretical spectrum corresponding to the nominal value of the morphology parameter, and carrying out the calculation of the interpolation theoretical spectrum. obtaining a measurement spectrum through measurement, calculating a deviation value between the measurement spectrum and a theoretical spectrum, and when the deviation value does not meet a threshold value condition, updating the nominal value of the morphology parameter until the deviation value meets the threshold value condition, so that the extraction speed is increased under the condition that the extraction accuracy is not influenced, and the techn</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyz0KwkAQQOE0FqLeYey1CIsRSwmKhVilD-PuJFnI_jAzCrm9AT2A1Wu-tyyau38y8gQB1Q4-9hBIh-QAowOZRClAlxhSVm9xBLGoSjzDHQjxm_grNTH2NM_Ov8K6WHQ4Cm1-XRXb66Wpb3vKqSXJaCmStvWjLM2hqo7mdDb_mA-pYTj5</recordid><startdate>20211029</startdate><enddate>20211029</enddate><creator>GUO CHUNFU</creator><creator>TAO ZE</creator><creator>SHI YUTUO</creator><creator>ZHANG HOUDAO</creator><creator>MA JUN</creator><creator>LI WEIQI</creator><scope>EVB</scope></search><sort><creationdate>20211029</creationdate><title>Library matching method and system for optical scattering, server and storage medium</title><author>GUO CHUNFU ; TAO ZE ; SHI YUTUO ; ZHANG HOUDAO ; MA JUN ; LI WEIQI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113566739A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>GUO CHUNFU</creatorcontrib><creatorcontrib>TAO ZE</creatorcontrib><creatorcontrib>SHI YUTUO</creatorcontrib><creatorcontrib>ZHANG HOUDAO</creatorcontrib><creatorcontrib>MA JUN</creatorcontrib><creatorcontrib>LI WEIQI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GUO CHUNFU</au><au>TAO ZE</au><au>SHI YUTUO</au><au>ZHANG HOUDAO</au><au>MA JUN</au><au>LI WEIQI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Library matching method and system for optical scattering, server and storage medium</title><date>2021-10-29</date><risdate>2021</risdate><abstract>The invention relates to a library matching method and system for optical scattering, a server and a readable storage medium, and the method comprises the steps: building a theoretical spectrum library for a to-be-measured target, setting a nominal value of a morphology parameter, carrying out the interpolation of the theoretical spectrum library of the morphology parameter, obtaining an interpolation theoretical spectrum corresponding to the nominal value of the morphology parameter, and carrying out the calculation of the interpolation theoretical spectrum. obtaining a measurement spectrum through measurement, calculating a deviation value between the measurement spectrum and a theoretical spectrum, and when the deviation value does not meet a threshold value condition, updating the nominal value of the morphology parameter until the deviation value meets the threshold value condition, so that the extraction speed is increased under the condition that the extraction accuracy is not influenced, and the techn</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN113566739A |
source | esp@cenet |
subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | Library matching method and system for optical scattering, server and storage medium |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T20%3A12%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=GUO%20CHUNFU&rft.date=2021-10-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN113566739A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |